Plasma Tuning Rods in Microwave Processing Systems

ABSTRACT

The invention provides a plurality of plasma tuning rod subsystems. The plasma tuning rod subsystems can comprise one or more microwave cavities configured to couple electromagnetic (EM) energy in a desired EM wave mode to a plasma by generating resonant microwave energy in one or more plasma tuning rods within and/or adjacent to the plasma. One or more microwave cavity assemblies can be coupled to a process chamber, and can comprise one or more tuning spaces/cavities. Each tuning space/cavity can have one or more plasma tuning rods coupled thereto. Some of the plasma tuning rods can be configured to couple the EM energy from one or more of the resonant cavities to the process space within the process chamber and thereby create uniform plasma within the process space.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is related to co-pending U.S. patent application Ser. No. 13/______, attorney docket No. TEA-045, entitled “Plasma-Tuning Rods in Surface Wave Antenna (SWA) Sources”, filed on even date herewith. This application is related to co-pending U.S. patent application Ser. No. 13/______, attorney docket No. TEA-074, entitled “Plasma Tuning Rods in Microwave Resonator Plasma Sources”, filed on even date herewith. The contents of each of these applications are herein incorporated by reference in their entireties.

BACKGROUND OF THE INVENTION

1. Field of the Invention

The present invention relates to substrate/wafer processing, and more particularly to microwave processing systems and methods for processing substrates and/or semiconductor wafers.

2. Description of the Related Art

Typically, during semiconductor processing, a (dry) plasma etch process is utilized to remove or etch material along fine lines or within vias or contacts patterned on a semiconductor substrate. The plasma etch process generally involves positioning a semiconductor substrate with an overlying patterned, protective layer, for example a photoresist layer, into a process chamber.

Once the substrate is positioned within the chamber, an ionizable, dissociative gas mixture is introduced within the chamber at a pre-specified flow rate, while a vacuum pump is throttled to achieve an ambient process pressure. Thereafter, a plasma is formed when a portion of the gas species present are ionized following a collision with an energetic electron. Moreover, the heated electrons serve to dissociate some species of the mixture gas species and create reactant specie(s) suitable for the etching exposed surfaces. Once the plasma is formed, any exposed surfaces of the substrate are etched by the plasma. The process is adjusted to achieve optimal conditions, including an appropriate concentration of desirable reactant and ion populations to etch various features (e.g., trenches, vias, contacts, etc.) in the exposed regions of the substrate. Such substrate materials where etching is required include silicon dioxide (SiO₂), poly-silicon, and silicon nitride, for example.

Conventionally, various techniques have been implemented for exciting a gas into plasma for the treatment of a substrate during semiconductor device fabrication, as described above. In particular, (“parallel plate”) capacitively coupled plasma (CCP) processing systems, or inductively coupled plasma (ICP) processing systems have been utilized commonly for plasma excitation. Among other types of plasma sources, there are microwave plasma sources (including those utilizing electron-cyclotron resonance (ECR)), surface wave plasma (SWP) sources, and helicon plasma sources.

It is becoming common wisdom that microwave-processing systems offer improved plasma processing performance, particularly for etching processes, over CCP systems, ICP systems and resonantly heated systems. Microwave processing systems produce a high degree of ionization at a relatively lower Boltzmann electron temperature (T_(e)). In addition, EM sources generally produce plasma richer in electronically excited molecular species with reduced molecular dissociation. However, the practical implementation of microwave processing systems still suffers from several deficiencies including, for example, plasma stability and uniformity.

SUMMARY OF THE INVENTION

The invention relates to a microwave processing systems and, more particularly, to stable and/or uniform cavity assemblies in microwave processing systems.

According to embodiments, a plurality of plasma tuning rod subsystems are described. The plasma tuning rod subsystems comprise one or more microwave cavities configured to couple electromagnetic (EM) energy in a desired EM wave mode to a plasma by generating resonant microwave energy in one or more plasma tuning rods within and/or adjacent to the plasma. One or more microwave cavity assemblies can be coupled to a process chamber can comprise one or more tuning spaces/cavities, and each tuning space/cavity can have one or more plasma tuning rods coupled thereto. Some of the plasma tuning rods can be configured to couple the EM energy from one or more of the resonant cavities to the process space within the process chamber and thereby create uniform plasma within the process space.

BRIEF DESCRIPTION OF THE DRAWINGS

Embodiments of the invention will now be described, by way of example only, with reference to the accompanying schematic drawings in which corresponding reference symbols indicate corresponding parts, and in which:

FIGS. 1A-1C illustrate different exemplary views of a first microwave processing system according to embodiments of the invention;

FIGS. 2A-2C illustrate different exemplary views of a second microwave processing system according to embodiments of the invention;

FIGS. 3A-3C illustrate different exemplary views of a third microwave processing system according to embodiments of the invention;

FIGS. 4A-4C illustrate different exemplary views of a fourth microwave processing system according to embodiments of the invention;

FIGS. 5A-5D show different views of exemplary plasma-tuning rods in accordance with embodiments of the invention;

FIGS. 6A-6D show different views of other exemplary plasma-tuning rods in accordance with embodiments of the invention;

FIGS. 7A-7D show different views of exemplary plasma-tuning rods in accordance with embodiments of the invention;

FIG. 8 illustrates a flow diagram for an exemplary operating procedure in accordance with embodiments of the invention; and

FIG. 9 illustrates a plasma processing system according to embodiments of the invention.

DETAILED DESCRIPTION

A microwave processing system is disclosed in various embodiments. However, one skilled in the relevant art will recognize that the various embodiments may be practiced without one or more of the specific details, or with other replacement and/or additional methods, materials, or components. In other instances, well-known structures, materials, or operations are not shown or described in detail to avoid obscuring aspects of various embodiments of the invention.

Similarly, for purposes of explanation, specific numbers, materials, and configurations are set forth in order to provide a thorough understanding of the invention. Nevertheless, the invention may be practiced without specific details. Furthermore, it is understood that the various embodiments shown in the figures are illustrative representations and are not necessarily drawn to scale.

Reference throughout this specification to “one embodiment” or “an embodiment” or variation thereof means that a particular feature, structure, material, or characteristic described in connection with the embodiment is included in at least one embodiment of the invention, but do not denote that they are present in every embodiment. Thus, the appearances of the phrases such as “in one embodiment” or “in an embodiment” in various places throughout this specification are not necessarily referring to the same embodiment of the invention. Furthermore, the particular features, structures, materials, or characteristics may be combined in any suitable manner in one or more embodiments.

Nonetheless, it should be appreciated that, contained within the description are features which, notwithstanding the inventive nature of the general concepts being explained, are also of an inventive nature.

Referring now to the drawings, wherein like reference numerals designate identical or corresponding parts throughout the several views, FIGS. 1A-1C illustrate different views of a first microwave processing system according to embodiments of the invention. The first microwave processing system 100 may be used in plasma curtain deposition system or a plasma enhanced deposition system.

FIG. 1A shows a partial cut-away top view of a process chamber 110 in a first microwave processing system 100. The top view shows an x/y plane view of a first interface assembly, a second interface assembly 112 b, and a plurality of additional chamber walls 112 coupled to the first interface assembly 112 a and the second interface assembly 112 b thereby forming the process chamber 110. For example, the chamber walls 112 can have wall thicknesses (t) associated therewith, and the wall thicknesses (t) can vary from about 1 mm to about 5 mm. The first interface assembly 112 a can have a first interface thickness (t_(i1)) associated therewith, and the first interface thickness (t_(i1)) can vary from about 1 mm to about 10 mm. The second interface assembly 112 b can have a second interface thickness (t_(i2)) associated therewith, and the second interface thickness (t_(i2)) can vary from about 1 mm to about 10 mm. The process space 115 can have a length (x_(T)) associated therewith, and the length (x_(T)) can vary from about 10 mm to about 500 mm.

The top view shows a cut-away view of a first cavity assembly 168 a having a first EM energy tuning space 169 a therein, and the first cavity assembly 168 a can include a first cavity wall 165 a, a second cavity wall 166 a, at least one third cavity wall 167 a, and one or more additional cavity walls (not shown). For example, the first cavity assembly 168 a can be coupled to the first interface assembly 112 a using the first cavity wall 165 a, and the walls (165 a, 166 a, and 167 a) can comprise dielectric material and can have wall thicknesses (t_(a)) associated therewith, and the wall thicknesses (t_(a)) can vary from about 1 mm to about 5 mm. In addition, the first EM energy tuning space 169 a can have a first length (x_(T1a)) and a first width (y_(1a)) associated therewith, the first length (x_(T1a)) can vary from about 10 mm to about 500 mm, and the first width (y_(1a)) can vary from about 5 mm to about 50 mm.

The top view also shows a cut-away view of a second cavity assembly 168 b having a second EM energy tuning space 169 b therein, and the second cavity assembly 168 b can include a first cavity wall 165 b, a second cavity wall 166 b, at least one third cavity wall 167 b, and one or more additional cavity walls (not shown). For example, and the second cavity assembly 168 b can be coupled to the second interface assembly 112 b using the first cavity wall 165 b, and walls (165 b, 166 b, and 167 b) can comprise dielectric material and can have wall thicknesses (t_(b)) associated therewith, and the wall thicknesses (t_(b)) can vary from about 1 mm to about 5 mm. In addition, the second EM energy tuning space 169 b can have a second length (x_(T1b)) and a second width (y_(1b)) associated therewith, the second length (x_(T1b)) can vary from about 10 mm to about 500 mm, and the second width (y_(1b)) can vary from about 5 mm to about 50 mm.

In some exemplary systems, a first set of isolation assemblies (164 a, 164 b, 164 c, 164 d, and 164 e) can be removably coupled to a first interface assembly 112 a and can be configured to isolate the process space 115 from the first EM energy tuning space 169 a. The first set of isolation assemblies (164 a, 164 b, 164 c, 164 d, and 164 e) can be used to removably couple the first set of plasma tuning rods {(170 a, 170 b, 170 c, 170 d, and 170 e) and (175 a, 175 b, 175 c, 175 d, and 175 e)} to a first interface assembly 112 a. For example, the first set of plasma-tuning portions (170 a, 170 b, 170 c, 170 d, and 170 e) can be configured in the process space 115, and the first set of EM-tuning portion (175 a, 175 b, 175 c, 175 d, and 175 e) can be configured within the first EM energy tuning space 169 a.

A second set of isolation assemblies (164 f, 164 g, 164 h, 164 i, and 164 j) can be removably coupled to the second interface assembly 112 b and can be configured to isolate the process space 115 from the second EM energy tuning space 169 b. The second set of isolation assemblies (164 f, 164 g, 164 h, 164 i, and 164 j) can be used to removably couple the second set of plasma tuning rods {(170 f, 170 g, 170 h, 170 i, and 170 j) and (175 f, 175 g, 175 h, 175 i, and 175 j)} to the second interface assembly 112 b. For example, the second set of plasma-tuning portions (170 f, 170 g, 170 h, 170 i, and 170 j) can be configured in the process space 115, and the second set of EM-tuning portion (175 f, 175 g, 175 h, 175 h, and 175 j) can be configured within the second EM energy tuning space 169 b.

Still referring to FIG. 1A, a first plasma-tuning rod (170 a, 175 a) can comprise dielectric material, can have a first plasma-tuning portion 170 a that can extend a first plasma-tuning distance 171 a into the process space 115 at a first location defined using (x_(2a)). For example, the first plasma-tuning distance 171 a can vary from about 10 mm to about 400 mm.

A first EM-coupling region 162 a can be established at a first EM-coupling distance 176 a from the first cavity wall 165 a within the first EM energy tuning space 169 a established in the first cavity assembly 168 a, and the first EM-tuning portion 175 a can extend into the first EM-coupling region 162 a. The first EM-tuning portion 175 a can obtain first microwave energy from the first EM-coupling region 162 a, and the first microwave energy can be transferred to the process space 115 at the first location (x_(2a)) using the first plasma-tuning portion 170 a. The first EM-coupling region 162 a can include a maximum field region, a maximum voltage region, maximum energy region, or a maximum current region, or any combination thereof. For example, the first EM-coupling distance 176 a can vary from about 0.01 mm to about 10 mm, and the first EM-coupling distance 176 a can be wavelength-dependent and can vary from about a (λ/4) to about (10λ).

A first plasma-tuning slab 161 a can be coupled to a first control assembly 160 a that can be used to move 163 a the first plasma-tuning slab 161 a a first EM-tuning distance 177 a relative to the first EM-tuning portion 175 a of the first plasma-tuning rod (170 a, 175 a) within the first EM energy tuning space 169 a. The first control assembly 160 a and the first plasma-tuning slab 161 a can comprise dielectric material and can be used to optimize the microwave energy coupled from the first EM-coupling region 162 a to the first EM-tuning portion 175 a of the first plasma-tuning rod (170 a, 175 a). Thr first EM-tuning distance 177 a can be established between the first EM-tuning portion 175 a and the first plasma-tuning slab 161 a within the first EM energy tuning space 169 a, and the first EM-tuning distance 177 a can vary from about 0.01 mm to about 1 mm.

The first plasma-tuning rod (170 a, 175 a) can have a first diameter (d_(1a)) associated therewith, and the first diameter (d_(1a)) can vary from about 0.01 mm to about 1 mm. The first plasma-tuning slab 161 a can have a first diameter (D_(1a)) associated therewith, and the first diameter (D_(1a)) can vary from about 1 mm to about 10 mm. The first EM-coupling region 162 a, the first control assembly 160 a, and the first plasma-tuning slab 161 a can have a first x/y plane offset (x_(1a)) associated therewith, and the first x/y plane offset (x_(1a)) can be wavelength-dependent and can vary from about a quarter wavelength (λ/4) to about (10λ). For example, first control assembly 160 a can have a cylindrical configuration and a diameter (d_(1a)) that can vary from about 1 mm to about 5 mm.

A second plasma-tuning rod (170 b, 175 b) can comprise dielectric material and can have a second plasma-tuning portion 170 b that can extend a second plasma-tuning distance 171 b into the process space 115 at a second location defined using (x_(1b)). For example, the second plasma-tuning distance 171 b can vary from about 10 mm to about 400 mm.

A second EM-coupling region 162 b can be established at a second EM-coupling distance 176 b from the first cavity wall 165 a within the first EM energy tuning space 169 a established in the first cavity assembly 168 a, and the second EM-tuning portion 175 b can extend into the second EM-coupling region 162 b. The second EM-tuning portion 175 b can obtain second microwave energy from the second EM-coupling region 162 b, and the second microwave energy can be transferred to the process space 115 at the second location (x_(1b)) using the second plasma-tuning portion 170 b. The second EM-coupling region 162 b can include a maximum field region, a maximum voltage region, maximum energy region, or a maximum current region, or any combination thereof. For example, the second EM-coupling distance 176 b can vary from about 0.01 mm to about 10 mm, and the second EM-coupling distance 176 b can be wavelength-dependent and can vary from about (λ/4) to about (10λ).

A second plasma-tuning slab 161 b can be coupled to a second control assembly 160 b and can be used to move 163 b the second plasma-tuning slab 161 b a second EM-tuning distance 177 b relative to the second EM-tuning portion 175 b of the second plasma-tuning rod (170 b, 175 b) within the first EM energy tuning space 169 a. The second control assembly 160 b and the second plasma-tuning slab 161 b can be used to optimize the microwave energy coupled from the second EM-coupling region 162 b to the second EM-tuning portion 175 b of the second plasma-tuning rod (170 b, 175 b). For example, the second EM-tuning distance 177 b can be established between the second EM-tuning portion 175 b and the second plasma-tuning slab 161 b within the first EM energy tuning space 169 a, and the second EM-tuning distance 177 b can vary from about 0.01 mm to about 1 mm.

The second plasma-tuning rod (170 b, 175 b) can have a second diameter (d_(1b)) associated therewith that can vary from about 0.01 mm to about 1 mm. The second plasma-tuning slab 161 b can comprise dielectric material and can have a second diameter (D_(1b)) associated therewith that can vary from about 1 mm to about 10 mm. The second EM-coupling region 162 b, the second control assembly 160 b, and the second plasma-tuning slab 161 b can have a second x/y plane offset (x_(1b)) associated therewith, and the second x/y plane offset (x_(1b)) can be wavelength-dependent and can vary from about a quarter wavelength (λ/4) to about (10λ). For example, the second control assembly 160 b can comprise dielectric material, can have a cylindrical configuration and a diameter (d_(1b)) that can vary from about 1 mm to about 5 mm.

A third plasma-tuning rod (170 c, 175 c) can comprise dielectric material and can have a third plasma-tuning portion 170 c that can extend a third plasma-tuning distance 171 c into the process space 115 at a third location defined using (x_(2c)). For example, the third plasma-tuning distance 171 c can vary from about 10 mm to about 400 mm.

A third EM-coupling region 162 c can be established at a third EM-coupling distance 176 c from the first cavity wall 165 a within the first EM energy tuning space 169 a established in the first cavity assembly 168 a, and the third EM-tuning portion 175 c can extend into the third EM-coupling region 162 c. The third EM-tuning portion 175 c can obtain third microwave energy from the third EM-coupling region 162 c, and the third microwave energy can be transferred to the process space 115 at the third location (x_(2c)) using the third plasma-tuning portion 170 c. The third EM-coupling region 162 c can include a maximum field region, a maximum voltage region, maximum energy region, or a maximum current region, or any combination thereof. For example, the third EM-coupling distance 176 c can vary from about 0.01 mm to about 10 mm, and the third EM-coupling distance 176 c can be wavelength-dependent and can vary from about (λ/4) to about (10λ).

A third plasma-tuning slab 161 c can be coupled to a third control assembly 160 c and can be used to move 163 c the third plasma-tuning slab 161 c a third EM-tuning distance 177 c relative to the third EM-tuning portion 175 c of the third plasma-tuning rod (170 c, 175 c) within the first EM energy tuning space 169 a. The third control assembly 160 c and the third plasma-tuning slab 161 c can be used to optimize the microwave energy coupled from the third EM-coupling region 162 c to the third EM-tuning portion 175 c of the third plasma-tuning rod (170 c, 175 c). For example, the third EM-tuning distance 177 c can be established between the third EM-tuning portion 175 c and the third plasma-tuning slab 161 c within the first EM energy tuning space 169 a, and the third EM-tuning distance 177 c can vary from about 0.01 mm to about 1 mm.

The third plasma-tuning rod (170 c, 175 c) can have a third diameter (d_(1c)) associated therewith that can vary from about 0.01 mm to about 1 mm. The third plasma-tuning slab 161 c can comprise dielectric material and can have a third diameter (D_(1c)) associated therewith that can vary from about 1 mm to about 10 mm. The third EM-coupling region 162 c, the third control assembly 160 c, and the third plasma-tuning slab 161 c can have a third x/y plane offset (x_(1c)) associated therewith, and the third x/y plane offset (x_(1c)) can be wavelength-dependent and can vary from about a quarter wavelength (λ/4) to about (10λ). The third control assembly 160 c can comprise dielectric material and can have a cylindrical configuration and a diameter (d_(1c)) that can vary from about 1 mm to about 5 mm.

A fourth plasma-tuning rod (170 d, 175 d) can comprise dielectric material and can have a fourth plasma-tuning portion 170 d that can extend a fourth plasma-tuning distance 171 d into the process space 115 at a fourth location defined using (x_(2d)). For example, the fourth plasma-tuning distance 171 d can vary from about 10 mm to about 400 mm.

A fourth EM-coupling region 162 d can be established at a fourth EM-coupling distance 176 d from the first cavity wall 165 a within the first EM energy tuning space 169 a established in the first cavity assembly 168 a, and the fourth EM-tuning portion 175 d can extend into the fourth EM-coupling region 162 d. The fourth EM-tuning portion 175 d can obtain fourth microwave energy from the fourth EM-coupling region 162 d, and the fourth microwave energy can be transferred to the process space 115 at the fourth location (x_(2d)) using the fourth plasma-tuning portion 170 d. The fourth EM-coupling region 162 d can include a maximum field region, a maximum voltage region, maximum energy region, or a maximum current region, or any combination thereof. For example, the fourth EM-coupling distance 176 d can vary from about 0.01 mm to about 10 mm, and the fourth EM-coupling distance 176 d can be wavelength-dependent and can vary from about (λ/4) to about (10λ).

A fourth plasma-tuning slab 161 d can be coupled to a fourth control assembly 160 d and can be used to move 163 d the fourth plasma-tuning slab 161 d a fourth EM-tuning distance 177 d relative to the fourth EM-tuning portion 175 d of the fourth plasma-tuning rod (170 d, 175 d) within the first EM energy tuning space 169 a. The fourth control assembly 160 d and the fourth plasma-tuning slab 161 d can be used to optimize the microwave energy coupled from the fourth EM-coupling region 162 d to the fourth EM-tuning portion 175 d of the fourth plasma-tuning rod (170 d, 175 d). For example, the fourth EM-tuning distance 177 d can be established between the fourth EM-tuning portion 175 d and the fourth plasma-tuning slab 161 d within the first EM energy tuning space 169 a, and the fourth EM-tuning distance 177 d can vary from about 0.01 mm to about 1 mm.

The fourth plasma-tuning rod (170 d, 175 d) can have a fourth diameter (d_(1d)) associated therewith that can vary from about 0.01 mm to about 1 mm. The fourth plasma-tuning slab 161 d can have a fourth diameter (D_(1d)) associated therewith that can vary from about 1 mm to about 10 mm. The fourth EM-coupling region 162 d, the fourth control assembly 160 d, and the fourth plasma-tuning slab 161 d can have a fourth x/y plane offset (x_(1d)) associated therewith, and the fourth x/y plane offset (x_(1d)) can be wavelength-dependent and can vary from about a quarter wavelength (λ/4) to about (10λ). The fourth control assembly 160 d can comprise dielectric material, can have a cylindrical configuration and a diameter (d_(1d)) that can vary from about 1 mm to about 5 mm.

A fifth plasma-tuning rod (170 e, 175 e) can comprise dielectric material and can have a fifth plasma-tuning portion 170 e that can extend a fifth plasma-tuning distance 171 e into the process space 115 at a fifth location defined using (x_(2e)). For example, the fifth plasma-tuning distance 171 e can vary from about 10 mm to about 400 mm.

A fifth EM-coupling region 162 e can be established at a fifth EM-coupling distance 176 e from the first cavity wall 165 a within the first EM energy tuning space 169 a established in the first cavity assembly 168 a, and the fifth EM-tuning portion 175 e can extend into the fifth EM-coupling region 162 e. The fifth EM-tuning portion 175 e can obtain fifth microwave energy from the fifth EM-coupling region 162 e, and the fifth microwave energy can be transferred to the process space 115 at the fifth location (x_(2e)) using the fifth plasma-tuning portion 170 e. The fifth EM-coupling region 162 e can include a maximum field region, a maximum voltage region, maximum energy region, or a maximum current region, or any combination thereof. For example, the fifth EM-coupling distance 176 e can vary from about 0.01 mm to about 10 mm, and the fifth EM-coupling distance 176 e can be wavelength-dependent and can vary from about (λ/4) to about (10λ).

A fifth plasma-tuning slab 161 e can comprise dielectric material and can be coupled to a fifth control assembly 160 e and can be used to move 163 e the fifth plasma-tuning slab 161 e a fifth EM-tuning distance 177 e relative to the fifth EM-tuning portion 175 e of the fifth plasma-tuning rod (170 e, 175 e) within the first EM energy tuning space 169 a. The fifth control assembly 160 e and the fifth plasma-tuning slab 161 e can be used to optimize the microwave energy coupled from the fifth EM-coupling region 162 e to the fifth EM-tuning portion 175 e of the fifth plasma-tuning rod (170 e, 175 e). For example, the fifth EM-tuning distance 177 e can be established between the fifth EM-tuning portion 175 e and the fifth plasma-tuning slab 161 e within the first EM energy tuning space 169 a, and the fifth EM-tuning distance 177 e can vary from about 0.01 mm to about 1 mm.

The fifth plasma-tuning rod (170 e, 175 e) can have a fifth diameter (d_(1e)) associated therewith that can vary from about 0.01 mm to about 1 mm. The fifth plasma-tuning slab 161 e can have a fifth diameter (D_(1e)) associated therewith that can vary from about 1 mm to about 10 mm. The fifth EM-coupling region 162 e, the fifth control assembly 160 e, and the fifth plasma-tuning slab 161 e can have a fifth x/y plane offset (x_(1e)) associated therewith, and the fifth x/y plane offset (x_(1e)) can be wavelength-dependent and can vary from about a quarter wavelength (λ/4) to about (10λ). The fifth control assembly 160 e can comprise dielectric material, can have a cylindrical configuration and a diameter (d_(1e)) that can vary from about 1 mm to about 5 mm.

Still referring to FIG. 1A, a sixth plasma-tuning rod (170 f, 175 f) can comprise dielectric material and can have a sixth plasma-tuning portion 170 f that can extend a sixth plasma-tuning distance 171 f into the process space 115 at a sixth location defined using (x_(2f)). The sixth plasma-tuning distance 171 f can vary from about 10 mm to about 400 mm.

A sixth EM-coupling region 162 f can comprise dielectric material and can be established at a sixth EM-coupling distance 176 f from the first cavity wall 165 b within the second EM energy tuning space 169 b established in the second cavity assembly 168 b, and the sixth EM-tuning portion 175 f can extend into the sixth EM-coupling region 162 f. The sixth EM-tuning portion 175 f can obtain sixth microwave energy from the sixth EM-coupling region 162 f, and the sixth microwave energy can be transferred to the process space 115 at the sixth location (x_(2f)) using the sixth plasma-tuning portion 170 f. The sixth EM-coupling region 162 f can include a maximum field region, a maximum voltage region, maximum energy region, or a maximum current region, or any combination thereof. The sixth EM-coupling distance 176 f can vary from about 0.01 mm to about 10 mm, or can be wavelength-dependent and can vary from about (λ/4) to about (10λ).

A sixth plasma-tuning slab 161 f can comprise dielectric material and can be coupled to a sixth control assembly 160 f and can be used to move 163 f the sixth plasma-tuning slab 161 f a sixth EM-tuning distance 177 f relative to the sixth EM-tuning portion 175 f of the sixth plasma-tuning rod (170 f, 175 f) within the second EM energy tuning space 169 b. The sixth control assembly 160 f and the sixth plasma-tuning slab 161 f can be used to optimize the microwave energy coupled from the sixth EM-coupling region 162 f to the sixth EM-tuning portion 175 f of the sixth plasma-tuning rod (170 f, 175 f). For example, the sixth EM-tuning distance 177 f can be established between the sixth EM-tuning portion 175 f and the sixth plasma-tuning slab 161 f within the second EM energy tuning space 169 b, and the sixth EM-tuning distance 177 f can vary from about 0.01 mm to about 1 mm.

The sixth plasma-tuning rod (170 f, 175 f) can have a sixth diameter (d_(1f)) associated therewith that can vary from about 0.01 mm to about 1 mm. The sixth plasma-tuning slab 161 f can have a sixth diameter (D_(1f)) associated therewith that can vary from about 1 mm to about 10 mm. The sixth EM-coupling region 162 f, the sixth control assembly 160 f, and the sixth plasma-tuning slab 161 f can have a sixth x/y plane offset (x_(1f)) associated therewith, and the sixth x/y plane offset (x_(1f)) can be wavelength-dependent and can vary from about a quarter wavelength (λ/4) to about (10λ). The sixth control assembly 160 f can comprise dielectric material, can have a cylindrical configuration and a diameter (d_(1f)) that can vary from about 1 mm to about 5 mm.

A seventh plasma-tuning rod (170 g, 175 g) can comprise dielectric material and can have a seventh plasma-tuning portion 170 g that can extend a seventh plasma-tuning distance 171 g into the process space 115 at a seventh location defined using (x_(2g)). The seventh plasma-tuning distance 171 g can vary from about 10 mm to about 400 mm.

A seventh EM-coupling region 162 g can be established at a seventh EM-coupling distance 176 g from the first cavity wall 165 b within the second EM energy tuning space 169 b established in the second cavity assembly 168 b, and the seventh EM-tuning portion 175 g can extend into the seventh EM-coupling region 162 g. The seventh EM-tuning portion 175 g can obtain seventh microwave energy from the seventh EM-coupling region 162 g, and the seventh microwave energy can be transferred to the process space 115 at the seventh location (x_(2g)) using the seventh plasma-tuning portion 170 g. The seventh EM-coupling region 162 g can include a maximum field region, a maximum voltage region, maximum energy region, or a maximum current region, or any combination thereof. For example, the seventh EM-coupling distance 176 g can vary from about 0.01 mm to about 10 mm, and the seventh EM-coupling distance 176 g can be wavelength-dependent and can vary from about (λ/4) to about (10λ).

A seventh plasma-tuning slab 161 g can comprise dielectric material and can be coupled to a seventh control assembly 160 g and can be used to move 163 g the seventh plasma-tuning slab 161 g a seventh EM-tuning distance 177 g relative to the seventh EM-tuning portion 175 g of the seventh plasma-tuning rod (170 g, 175 g) within the second EM energy tuning space 169 b. The seventh control assembly 160 g and the seventh plasma-tuning slab 161 g can be used to optimize the microwave energy coupled from the seventh EM-coupling region 162 g to the seventh EM-tuning portion 175 g of the seventh plasma-tuning rod (170 g, 175 g). For example, the seventh EM-tuning distance 177 g can be established between the seventh EM-tuning portion 175 g and the seventh plasma-tuning slab 161 g within the second EM energy tuning space 169 b, and the seventh EM-tuning distance 177 g can vary from about 0.01 mm to about 1 mm.

The seventh plasma-tuning rod (170 g, 175 g) can have a seventh diameter (d_(1g)) associated therewith that can vary from about 0.01 mm to about 1 mm. The seventh plasma-tuning slab 161 g can have a seventh diameter (D_(1g)) associated therewith that can vary from about 1 mm to about 10 mm. The seventh EM-coupling region 162 g, the seventh control assembly 160 g, and the seventh plasma-tuning slab 161 g can have a seventh x/y plane offset (x_(1g)) associated therewith, and the seventh x/y plane offset (x_(1g)) can be wavelength-dependent and can vary from about a quarter wavelength (λ/4) to about (10λ). The seventh control assembly 160 g can comprise dielectric material, can have a cylindrical configuration and a diameter (d_(1g)) that can vary from about 1 mm to about 5 mm.

An eighth plasma-tuning rod (170 h, 175 h) can comprise dielectric material and can have an eighth plasma-tuning portion 170 h that can extend an eighth plasma-tuning distance 171 h into the process space 115 at an eighth location defined using (x_(2h)). The eighth plasma-tuning distance 171 h can vary from about 10 mm to about 400 mm.

An eighth EM-coupling region 162 h can be established at an eighth EM-coupling distance 176 h from the first cavity wall 165 b within the second EM energy tuning space 169 b established in the second cavity assembly 168 b, and the eighth EM-tuning portion 175 h can extend into the eighth EM-coupling region 162 h. The eighth EM-tuning portion 175 h can obtain eighth microwave energy from the eighth EM-coupling region 162 h, and the eighth microwave energy can be transferred to the process space 115 at the eighth location (x_(2h)) using the eighth plasma-tuning portion 170 h. The eighth EM-coupling region 162 h can include a maximum field region, a maximum voltage region, maximum energy region, or a maximum current region, or any combination thereof. For example, the eighth EM-coupling distance 176 h can vary from about 0.01 mm to about 10 mm, and the eighth EM-coupling distance 176 h can be wavelength-dependent and can vary from about (λ/4) to about (10λ).

An eighth plasma-tuning slab 161 h can comprise dielectric material and can be coupled to an eighth control assembly 160 h and can be used to move 163 h the eighth plasma-tuning slab 161 h an eighth EM-tuning distance 177 h relative to the eighth EM-tuning portion 175 h of the eighth plasma-tuning rod (170 h, 175 h) within the second EM energy tuning space 169 b. The eighth control assembly 160 h and the eighth plasma-tuning slab 161 h can be used to optimize the microwave energy coupled from the eighth EM-coupling region 162 h to the eighth EM-tuning portion 175 h of the eighth plasma-tuning rod (170 h, 175 h). The eighth EM-tuning distance 177 h can be established between the eighth EM-tuning portion 175 h and the eighth plasma-tuning slab 161 h within the second EM energy tuning space 169 b, and the eighth EM-tuning distance 177 h can vary from about 0.01 mm to about 1 mm.

The eighth plasma-tuning rod (170 h, 175 h) can have an eighth diameter (d_(1h)) associated therewith that can vary from about 0.01 mm to about 1 mm. The eighth plasma-tuning slab 161 h can have an eighth diameter (D_(1h)) associated therewith that can vary from about 1 mm to about 10 mm. The eighth EM-coupling region 162 h, the eighth control assembly 160 h, and the eighth plasma-tuning slab 161 h can have an eighth x/y plane offset (x_(1h)) associated therewith, and the eighth x/y plane offset (x_(1h)) can be wavelength-dependent and can vary from about a quarter wavelength (λ/4) to about (10λ). The eighth control assembly 160 h can comprise dielectric material, can have a cylindrical configuration and a diameter (d_(1h)) that can vary from about 1 mm to about 5 mm.

A ninth plasma-tuning rod (170 i, 175 i) can comprise dielectric material and can have a ninth plasma-tuning portion 170 i that can extend a ninth plasma-tuning distance 171 i into the process space 115 at a ninth location defined using (x₂). For example, the ninth plasma-tuning distance 171 i can vary from about 10 mm to about 400 mm.

A ninth EM-coupling region 162 i can be established at a ninth EM-coupling distance 176 i from the first cavity wall 165 b within the second EM energy tuning space 169 b established in the second cavity assembly 168 b, and the ninth EM-tuning portion 175 i can extend into the ninth EM-coupling region 162 i. The ninth EM-tuning portion 175 i can obtain ninth microwave energy from the ninth EM-coupling region 162 i, and the ninth microwave energy can be transferred to the process space 115 at the ninth location (x₂) using the ninth plasma-tuning portion 170 i. The ninth EM-coupling region 162 i can include a maximum field region, a maximum voltage region, maximum energy region, or a maximum current region, or any combination thereof. For example, the ninth EM-coupling distance 176 i can vary from about 0.01 mm to about 10 mm, and the ninth EM-coupling distance 176 i can be wavelength-dependent and can vary from about (λ/4) to about (10λ).

A ninth plasma-tuning slab 161 i can comprise dielectric material and can be coupled to a ninth control assembly 160 i and can be used to move 163 i the ninth plasma-tuning slab 161 i a ninth EM-tuning distance 177 i relative to the ninth EM-tuning portion 175 i of the ninth plasma-tuning rod (170 i, 175 i) within the second EM energy tuning space 169 b. The ninth control assembly 160 i and the ninth plasma-tuning slab 161 i can be used to optimize the microwave energy coupled from the ninth EM-coupling region 162 i to the ninth EM-tuning portion 175 i of the ninth plasma-tuning rod (170 i, 175 i). For example, the ninth EM-tuning distance 177 i can be established between the ninth EM-tuning portion 175 i and the ninth plasma-tuning slab 161 i within the second EM energy tuning space 169 b, and the ninth EM-tuning distance 177 i can vary from about 0.01 mm to about 1 mm.

The ninth plasma-tuning rod (170 i, 175 i) can have a ninth diameter (d_(1i)) associated therewith that can vary from about 0.01 mm to about 1 mm. The ninth plasma-tuning slab 161 i can have a ninth diameter (D_(1i)) associated therewith that can vary from about 1 mm to about 10 mm. The ninth EM-coupling region 162 i, the ninth control assembly 160 i, and the ninth plasma-tuning slab 161 i can have a ninth x/y plane offset (x_(1i)) associated therewith, and the ninth x/y plane offset (x_(1i)) can be wavelength-dependent and can vary from about a quarter wavelength (λ/4) to about (10λ). The ninth control assembly 160 i can comprise dielectric material, can have a cylindrical configuration and a diameter (d_(1i)) that can vary from about 1 mm to about 5 mm.

A tenth plasma-tuning rod (170 j, 175 j) can comprise dielectric material and can have a tenth plasma-tuning portion 170 j that can extend a tenth plasma-tuning distance 171 j into the process space 115 at a tenth location defined using (x_(2j)). For example, the tenth plasma-tuning distance 171 j can vary from about 10 mm to about 400 mm.

A tenth EM-coupling region 162 j can be established at a tenth EM-coupling distance 176 j from the first cavity wall 165 b within the second EM energy tuning space 169 b established in the second cavity assembly 168 b, and the tenth EM-tuning portion 175 j can extend into the tenth EM-coupling region 162 j. The tenth EM-tuning portion 175 j can obtain tenth microwave energy from the tenth EM-coupling region 162 j, and the tenth microwave energy can be transferred to the process space 115 at the tenth location (x_(2j)) using the tenth plasma-tuning portion 170 j. The tenth EM-coupling region 162 j can include a maximum field region, a maximum voltage region, maximum energy region, or a maximum current region, or any combination thereof. For example, the tenth EM-coupling distance 176 j can vary from about 0.01 mm to about 10 mm, and the tenth EM-coupling distance 176 j can be wavelength-dependent and can vary from about (λ/4) to about (10λ).

A tenth plasma-tuning slab 161 j can comprise dielectric material, can be coupled to a tenth control assembly 160 j and can be used to move 163 j the tenth plasma-tuning slab 161 j a tenth EM-tuning distance 177 j relative to the tenth EM-tuning portion 175 j of the tenth plasma-tuning rod (170 j, 175 j) within the second EM energy tuning space 169 b. The tenth control assembly 160 j and the tenth plasma-tuning slab 161 j can be used to optimize the microwave energy coupled from the tenth EM-coupling region 162 j to the tenth EM-tuning portion 175 j of the tenth plasma-tuning rod (170 j, 175 j). For example, the tenth EM-tuning distance 177 j can be established between the tenth EM-tuning portion 175 j and the tenth plasma-tuning slab 161 j within the second EM energy tuning space 169 b, and the tenth EM-tuning distance 177 j can vary from about 0.01 mm to about 1 mm.

The tenth plasma-tuning rod (170 j, 175 j) can have a tenth diameter (d_(1i)) associated therewith that can vary from about 0.01 mm to about 1 mm. The tenth plasma-tuning slab 161 j can have a tenth diameter (D_(1d)) associated therewith that can vary from about 1 mm to about 10 mm. The tenth EM-coupling region 162 j, the tenth control assembly 160 j, and the tenth plasma-tuning slab 161 j can have a tenth x/y plane offset (x_(1j)) associated therewith, and the tenth x/y plane offset (x_(ij)) can be wavelength-dependent and can vary from about a quarter wavelength (λ/4) to about (10λ). The tenth control assembly 160 j can comprise dielectric material, can have a cylindrical configuration and a diameter (d_(1j)) that can vary from about 1 mm to about 5 mm.

The top view of first microwave processing system 100 includes a top view of a first cavity-control assembly 145 a that is shown coupled to a top view of a first cavity-tuning slab 146 a. The first cavity-control assembly 145 a can have a first diameter (d_(1aa)) associated therewith, and the first diameter (d_(1aa)) can vary from about 0.01 mm to about 1 mm. The first cavity-tuning slab 146 a can have a second diameter (D_(1aa)) associated therewith, and the second diameter (D_(1aa)) can vary from about 1 mm to about 10 mm. The first cavity-control assembly 145 a and the first cavity-tuning slab 146 a can have a first x/y plane offset (y_(1aa)) associated therewith that can vary from about 1 mm to about 10 mm.

In addition, the top view of first microwave processing system 100 includes a top view of a second cavity-control assembly 145 b that is shown coupled to a top view of a second cavity-tuning slab 146 b. The second cavity-control assembly 145 b can have a first additional diameter (d_(1ba)) associated therewith, and the first additional diameter (d_(1ba)) can vary from about 0.01 mm to about 1 mm. The second cavity-tuning slab 146 b can have a second additional diameter (D_(1ba)) associated therewith, and the second additional diameter (D_(1ba)) can vary from about 1 mm to about 10 mm. The second cavity-control assembly 145 b and the second cavity-tuning slab 146 b can have a second x/y plane offset (y_(1ba)) associated therewith, and the second x/y plane offset (y_(1ba)) vary from about 1 mm to about 10 mm.

FIG. 1B shows a partial cut-away front view of a process chamber 110 in a first microwave processing system 100. The front view shows an x/z plane view of a plurality of additional walls 112 coupled to each other, thereby creating a partial cut-away front view of a process space 115 in the process chamber 110. The first microwave processing system 100 can be configured to form plasma in the process space 115.

The front view shows a cut-away view of a first cavity assembly 168 a having a first EM energy tuning space 169 a therein, and the first cavity assembly 168 a can include a first cavity wall 165 a, a second cavity wall 166 a, at least one third cavity wall 167 a, and one or more additional cavity walls (not shown). For example, and the first cavity assembly 168 a can be coupled to the first interface assembly 112 a using the first cavity wall 165 a. The front view also shows a cut-away view of a second cavity assembly 168 b having a second EM energy tuning space 169 b therein, and the second cavity assembly 168 b can include a first cavity wall 165 b, a second cavity wall 166 b, at least one third cavity wall 167 b, and one or more additional cavity walls (not shown). For example, and the second cavity assembly 168 b can be coupled to the second interface assembly 112 b using the first cavity wall 165 b.

A partial front view (dash line view) of a first set of plasma tuning rods (170 a-170 e), a partial front view (dash line view) of a first set of plasma-tuning slabs (161 a-161 e), a partial front view (dotted line view) of a second set of plasma tuning rods (170 f-170 j), and a partial front view (dotted line view) of a second set of plasma-tuning slabs (161 f-161 j) are shown in FIG. 1B.

The first set of plasma tuning rods (170 a-170 e) and the first set of plasma-tuning slabs (161 a-161 e) can have a first set of x/y plane offsets (x_(2a-e)) associated therewith, and the first set of x/y plane offsets (x_(2a-e)) can vary from about 10 mm to about 100 mm. The first set of plasma tuning rods (170 a-170 e) and the first set of plasma-tuning slabs (161 a-161 e) can have a first set of x/z plane offsets (z_(1a-e)) associated therewith, and the first set of x/z plane offsets (z_(1a-e)) can vary from about 100 mm to about 400 mm.

The second set of plasma tuning rods (170 f-170 j) and the second set of plasma-tuning slabs (161 f-161 j) can have a second set of x/y plane offsets (x_(2fj)) associated therewith, and the second set of x/y plane offsets (x_(2fj)) can vary from about 10 mm to about 100 mm. The second set of plasma tuning rods (170 f-170 j) and the second set of plasma-tuning slabs (161 f-161 j) can have a second set of x/z plane offsets (z_(1f-j)) associated therewith, and the second set of x/z plane offsets (z_(1f-j)) can vary from about 100 mm to about 400 mm.

FIG. 1B shows that the first microwave processing system 100 can include one or more plasma sensors 106 coupled to a chamber wall 112 to obtain first plasma data. In addition, the first microwave processing system 100 may be configured to process 200 mm substrates, 300 mm substrates, or larger-sized substrates. In addition, square and/or rectangular chambers can be configured so that the first microwave processing system 100 may be configured to process square or rectangular substrates, wafers, or LCDs regardless of their size, as would be appreciated by those skilled in the art. Therefore, while aspects of the invention will be described in connection with the processing of a semiconductor substrate, the invention is not limited solely thereto.

As shown in FIG. 1B, a first EM source 150 a can be coupled to a first cavity assembly 168 a, and a second EM source 150 b can be coupled to a second cavity assembly 168 b. The first EM source 150 a can be coupled to a first matching network 152 a, and the first matching network 152 a can be coupled to a first coupling network 154 a. The second EM source 150 b can be coupled to a second matching network 152 b, and the second matching network 152 b can be coupled to a second coupling network 154 b. Alternatively, a plurality of matching networks (not shown) or a plurality of coupling networks (not shown) may be used.

The first coupling network 154 a can be removably coupled to the first cavity assembly 168 a that can be removably coupled to an upper portion of a first interface assembly 112 a of the process chamber 110. The first coupling network 154 a can be used to provide microwave energy to the first EM energy tuning space 169 a in the first cavity assembly 168 a. The second coupling network 154 b can be removably coupled to the second cavity assembly 168 b that can be removably coupled to an upper portion of a second interface assembly 112 b of the process chamber 110. The second coupling network 154 b can be used to provide additional microwave energy to the second EM energy tuning space 169 b in the second cavity assembly 168 b. Alternatively, other EM-coupling configurations may be used.

As shown in FIG. 1B, a controller 195 can be coupled 196 to the EM sources (150 a, 150 b), the matching networks (152 a, 152 b), the coupling networks (154 a, 154 b), and the cavity assemblies (168 a, 168 b), and the controller 195 can use process recipes to establish, control, and optimize the EM sources (150 a, 150 b), the matching networks (152 a, 152 b), the coupling networks (154 a, 154 b), and the cavity assemblies (168 a, 168 b) to control the plasma uniformity within the process space 115. For example, the EM sources (150 a, 150 b) can operate at a frequency from about 500 MHz to about 5000 MHz. In addition, the controller 195 can be coupled 196 to the plasma sensors 106 and process sensors 107, and the controller 195 can use process recipes to establish, control, and optimize the data from the plasma sensors 106 and the process sensors 107 to control the plasma uniformity within the process space 115.

In addition, the controller 195 can be coupled 196 to gas supply system 140, to a gas supply subassembly 141, and to a gas showerhead 143. For example, the gas supply system 140, the gas supply subassembly 141 and the gas showerhead 143 can be configured to introduce one or more process gases to process space 115, and can include flow control and/or flow measuring devices.

During dry plasma etching, the process gas may comprise an etchant, a passivant, or an inert gas, or a combination of two or more thereof. For example, when plasma etching a dielectric film such as silicon oxide (SiO_(x)) or silicon nitride (Si_(x)N_(y)), the plasma etch gas composition generally includes a fluorocarbon-based chemistry (C_(x)F_(y)) such as at least one of C₄F₈, C₅F₈, C₃F₆, C₄F₆, CF₄, etc., and/or may include a fluorohydrocarbon-based chemistry (C_(x)H_(y)F_(z)) such as at least one of CHF₃, CH₂F₂, etc., and can have at least one of an inert gas, oxygen, CO or CO₂. Additionally, for example, when etching polycrystalline silicon (polysilicon), the plasma etch gas composition generally includes a halogen-containing gas such as HBr, Cl₂, NF₃, or SF₆ or a combination of two or more thereof, and may include fluorohydrocarbon-based chemistry (C_(x)H_(y)F_(z)) such as at least one of CHF₃, CH₂F₂, etc., and at least one of an inert gas, oxygen, CO or CO₂, or two or more thereof. During plasma-enhanced deposition, the process gas may comprise a film forming precursor, a reduction gas, or an inert gas, or a combination of two or more thereof.

As shown in FIG. 1B, the first microwave processing system 100 can include a pressure control system 190 and port 191 coupled to the process chamber 110, and configured to evacuate the process chamber 110, as well as control the pressure within the process chamber 110. In addition, the first microwave processing system 100 can include a movable substrate holder 120 for processing substrate 105.

The front view of first microwave processing system 100 includes a partial front view of a first cavity-control assembly 145 a that is shown coupled to a front view of a first cavity-tuning slab 146 a. The first cavity-control assembly 145 a and the first cavity-tuning slab 146 a can have a first x/z plane offset (z_(1aa)) associated therewith, and the first x/z plane offset (z_(1aa)) can vary from about 1 mm to about 10 mm.

The first cavity-control assembly 145 a can be used to move 147 a the first cavity-tuning slab 146 a cavity-tuning distances 148 a within the first EM-energy tuning space 169 a. The controller 195 can be coupled 196 to the cavity-control assembly 145 a, and the controller 195 can use process recipes to establish, control, and optimize the cavity-tuning distances 148 a to control and maintain the plasma uniformity within the process space 115 in real-time. For example, the cavity-tuning distances 148 a can vary from about 0.01 mm to about 10 mm, and the cavity-tuning distances 148 a can be wavelength-dependent and can vary from about (λ/4) to about (10λ).

In addition, the front view of first microwave processing system 100 includes a partial front view of a second cavity-control assembly 145 b that is shown coupled to a front view of a second cavity-tuning slab 146 b. The second cavity-control assembly 145 b and the second cavity-tuning slab 146 b can have a second x/z plane offset (z_(1ba)) associated therewith, and the second x/z plane offset (z_(1ba)) vary from about 1 mm to about 10 mm.

The second cavity-control assembly 145 b can be used to move 147 b the second cavity-tuning slab 146 b second cavity-tuning distances 148 b within the second EM-energy tuning space 169 b. The controller 195 can be coupled 196 to the second cavity-control assembly 145 b, and the controller 195 can use process recipes to establish, control, and optimize the second cavity-tuning distances 148 b to control and maintain the plasma uniformity within the process space 115 in real-time. For example, the second cavity-tuning distances 148 b can vary from about 0.01 mm to about 10 mm, and the second cavity-tuning distances 148 b can be wavelength-dependent and can vary from about (λ/4) to about (10λ).

FIG. 1C shows a partial cut-away side view of the process chamber 110 in the first microwave processing system 100. The side view shows a y/z plane view of a plurality of chamber walls 112 coupled to a first interface assembly 112 a and to a second interface assembly 112 b, thereby creating a partial cut-away y/z plane view of the process space 115 in the process chamber 110. The first microwave processing system 100 can be configured to form uniform plasma in the process space 115.

A partial side view of a first EM energy tuning space 169 a in the first cavity assembly 168 a and a partial side view of a second EM energy tuning space 169 b in the second cavity assembly 168 b are shown in FIG. 1C. A partial side view of the first set of plasma tuning rods (170 a-170 e), a partial side view of a first set of plasma-tuning slabs (161 a-161 e), a partial side view of a second set of plasma tuning rods (170 f-170 j), and a partial side view of a second set of plasma-tuning slabs (161 f-161 j) are shown in FIG. 1C.

Side views of a first set of isolation assemblies (164 a, 164 b, 164 c, 164 d, and 164 e) and a second set of isolation assemblies (164 f, 164 g, 164 h, 164 i, and 164 j) are also shown in FIG. 1C. For example, first set of isolation assemblies (164 a, 164 b, 164 c, 164 d, and 164 e) can be used to removably couple the first set of plasma tuning rods {(170 a, 170 b, 170 c, 170 d, and 170 e) and (175 a, 175 b, 175 c, 175 d, and 175 e)} to a first interface assembly 112 a. Each of the first set of isolation assemblies (164 a, 164 b, 164 c, 164 d, and 164 e) can be removably coupled to a first interface assembly 112 a. In addition, the second set of isolation assemblies (164 f, 164 g, 164 h, 164 i, and 164 j) can be used to removably couple the second set of plasma tuning rods {(170 f, 170 g, 170 h, 170 i, and 170 j) and (175 f, 175 g, 175 h, 175 h, and 175 j)} to a second interface assembly 112 b. Each of the second set of isolation assemblies (164 f, 164 g, 164 h, 164 i, and 164 j) can be removably coupled to a second interface assembly 112 b.

As shown in FIG. 1C, a first set of plasma-tuning slabs (161 a, 161 b, 161 c, 161 d, and 161 e) can be coupled to a first set of control assemblies (160 a, 160 b, 160 c, 160 d, and 160 e), and first set of control assemblies (160 a, 160 b, 160 c, 160 d, and 160 e) can be used to move (163 a, 163 b, 163 c, 163 d, and 163 e) the first set of plasma-tuning slabs (161 a, 161 b, 161 c, 161 d, and 161 e) the first set of EM-tuning distances (177 a, 177 b, 177 c, 177 d, and 177 e) relative to the EM-tuning portions (175 a, 175 b, 175 c, 175 d, and 175 e) within the first EM energy tuning space 169 a. In addition, a second set of plasma-tuning slabs (161 f, 161 g, 161 h, 161 i, and 161 j) can be coupled to a second set of control assemblies (160 f, 160 g, 160 h, 160 i, and 160 j), and the second set of control assemblies (160 f, 160 g, 160 h, 160 i, and 160 j) can be used to move (163 f, 163 g, 163 h, 163 i, and 163 j) the second set of plasma-tuning slabs (161 f, 161 g, 161 h, 161 i, and 161 j) the second set of EM-tuning distances (177 f, 177 g, 177 h, 177 i, and 177 j) relative to the EM-tuning portions (175 f, 175 g, 175 h, 175 i, and 175 j) within the second EM energy tuning space 169 b.

The first set of control assemblies (160 a, 160 b, 160 c, 160 d, and 160 e) can be coupled 196 to the controller 195, and the controller 195 can use process recipes to establish, control, and optimize the first set of EM-tuning distances (177 a, 177 b, 177 c, 177 d, and 177 e) to control the plasma uniformity within the process space 115. In addition, the second set of control assemblies (160 f, 160 g, 160 h, 160 i, and 160 j) can be coupled 196 to the controller 195, and the controller 195 can use process recipes to establish, control, and optimize the second set of EM-tuning distances (177 f, 177 g, 177 h, 177 i, and 177 j) to control the plasma uniformity within the process space 115.

The controller 195 can be coupled 196 to the EM sources (150 a, 150 b), the matching networks (152 a, 152 b), the coupling networks (154 a, 154 b), and the cavity assemblies (168 a, 168 b), and the controller 195 can use process recipes to establish, control, and optimize the EM sources (150 a, 150 b), the matching networks (152 a, 152 b), the coupling networks (154 a, 154 b), and the cavity assemblies (168 a, 168 b) to control the plasma uniformity within the process space 115. For example, the EM sources (150 a, 150 b) can operate at frequencies from about 500 MHz to about 5000 MHz. In addition, the controller 195 can be coupled 196 to the plasma sensors 106, the process sensors 107, and the cavity sensors (108 a and 108 b), and the controller 195 can use process recipes to establish, control, and optimize the data from the plasma sensors 106, the process sensors 107, and the cavity sensors (108 a and 108 b), to control the plasma uniformity within the process space 115.

The side view illustrates a process chamber 110 having a total width (y_(T)), and a total height (z_(T)) associated therewith in the y/z plane. The total width (y_(T)) can vary from about 50 mm to about 500 mm, and the total height (z_(T)) can vary from about 50 mm to about 500 mm.

FIG. 2A shows a partial cut-away top view of a second process chamber 210 in a second microwave processing system 200. The top view shows an x/y plane view of a first interface assembly 212 a, a second interface assembly 212 b, and a plurality of additional chamber walls 212 coupled to the first interface assembly 212 a and the second interface assembly 212 b thereby forming the second process chamber 210. For example, the chamber walls 212 can have wall thicknesses (t) associated therewith, and the wall thicknesses (t) can vary from about 1 mm to about 5 mm. The first interface assembly 212 a can have a first interface thickness (t_(i1)) associated therewith, and the first interface thickness (t_(i1)) can vary from about 1 mm to about 10 mm. The second interface assembly 212 b can have a second interface thickness (t_(i2)) associated therewith, and the second interface thickness (t_(i2)) can vary from about 1 mm to about 10 mm. The process space 215 can have a length (x_(T)) associated therewith, and the length (x_(T)) can vary from about 10 mm to about 500 mm.

The top view of the second microwave processing system 200 shows a cut-away view of a first cavity assembly 268 a having a first EM energy tuning space 269 a therein, and the first cavity assembly 268 a can include a first cavity wall 265 a, a second cavity wall 266 a, at least one third cavity wall 267 a, and one or more additional cavity walls (not shown). For example, and the first cavity assembly 268 a can be coupled to the first interface assembly 212 a using the first cavity wall 265 a, and walls (265 a, 266 a, and 267 a) can comprise dielectric material and can have wall thicknesses (t_(a)) associated therewith, and the wall thicknesses (t_(a)) can vary from about 1 mm to about 5 mm. In addition, the first EM energy tuning space 269 a can have a first length (x_(T1a)) and a first width (y_(1a)) associated therewith, the first length (x_(T1a)) can vary from about 10 mm to about 500 mm, and the first width (y_(1a)) can vary from about 5 mm to about 50 mm.

The top view of the second microwave processing system 200 also shows a cut-away view of a second cavity assembly 268 b having a second EM energy tuning space 269 b therein, and the second cavity assembly 268 b can include a first cavity wall 265 b, a second cavity wall 266 b, at least one third cavity wall 267 b, and one or more additional cavity walls (not shown). For example, and the second cavity assembly 268 b can be coupled to the second interface assembly 212 b using the first cavity wall 265 b, and walls (265 b, 266 b, and 267 b) can comprise dielectric material and can have wall thicknesses (t_(b)) associated therewith, and the wall thicknesses (t_(b)) can vary from about 1 mm to about 5 mm. In addition, the second EM energy tuning space 269 b can have a second length (x_(T1b)) and a second width (y_(1b)) associated therewith, the second length (x_(T1b)) can vary from about 10 mm to about 500 mm, and the second width (y_(1b)) can vary from about 5 mm to about 50 mm.

In some exemplary systems, a first set of isolation assemblies (264 a, 264 b, 264 c, and 264 d) can be removably coupled to a first interface assembly 212 a and can be configured to isolate the process space 215 from the first EM energy tuning space 269 a. The first set of isolation assemblies (264 a, 264 b, 264 c, and 264 d) can be used to removably couple the first set of plasma tuning rods {(270 a, 270 b, 270 c, and 270 d) and (275 a, 275 b, 275 c, 275 d)} to a first interface assembly 212 a. For example, the first set of plasma-tuning portions (270 a, 270 b, 270 c, and 270 d) can be configured in the process space 215, and the first set of EM-tuning portion (275 a, 275 b, 275 c, and 275 d) can be configured within the first EM energy tuning space 269 a.

A second set of isolation assemblies (264 e, 264 f, 264 g, and 264 h) can be removably coupled to the second interface assembly 212 b and can be configured to isolate the process space 215 from the second EM energy tuning space 269 b. The second set of isolation assemblies (264 e, 264 f, 264 g, and 264 h) can be used to removably couple the second set of plasma tuning rods {(270 e, 270 f, 270 g, and 270 h) and (275 e, 275 f, 275 g, and 275 h)} to the second interface assembly 212 b. For example, the second set of plasma-tuning portions (270 e, 270 f, 270 g, and 270 h) can be configured in the process space 215, and the second set of EM-tuning portion (275 e, 275 f, 275 g, and 275 h) can be configured within the second EM energy tuning space 269 b.

Still referring to FIG. 2A, a first plasma-tuning rod (270 a, 275 a) can comprise dielectric material and can have a first plasma-tuning portion 270 a that can extend a first plasma-tuning distance 271 a into the process space 215 at a first location defined using (x_(2a)). The first plasma-tuning distance 271 a can vary from about 10 mm to about 400 mm.

A first EM-coupling region 262 a can be established at a first EM-coupling distance 276 a from the first cavity wall 265 a within the first EM energy tuning space 269 a established in the first cavity assembly 268 a, and the first EM-tuning portion 275 a can extend into the first EM-coupling region 262 a. The first EM-tuning portion 275 a can obtain first microwave energy from the first EM-coupling region 262 a, and the first microwave energy can be transferred to the process space 215 at the first location (x_(2a)) using the first plasma-tuning portion 270 a. The first EM-coupling region 262 a can include a maximum field region, a maximum voltage region, maximum energy region, or a maximum current region, or any combination thereof. For example, the first EM-coupling distance 276 a can vary from about 0.01 mm to about 10 mm, and the first EM-coupling distance 276 a can be wavelength-dependent and can vary from about (λ/4) to about (10λ).

A first plasma-tuning slab 261 a can comprise dielectric material, can be coupled to a first control assembly 260 a, and can be used to move 263 a the first plasma-tuning slab 261 a a first EM-tuning distance 277 a relative to the first EM-tuning portion 275 a of the first plasma-tuning rod (270 a, 275 a) within the first EM energy tuning space 269 a. The first control assembly 260 a and the first plasma-tuning slab 261 a can be used to optimize the microwave energy coupled from the first EM-coupling region 262 a to the first EM-tuning portion 275 a of the first plasma-tuning rod (270 a, 275 a). For example, the first EM-tuning distance 277 a can be established between the first EM-tuning portion 275 a and the first plasma-tuning slab 261 a within the first EM energy tuning space 269 a, and the first EM-tuning distance 277 a can vary from about 0.01 mm to about 1 mm.

The first plasma-tuning rod (270 a, 275 a) can have a first diameter (d_(1a)) associated therewith that can vary from about 0.01 mm to about 1 mm. The first plasma-tuning slab 261 a can have a first diameter (D_(1a)) associated therewith that can vary from about 1 mm to about 10 mm. The first EM-coupling region 262 a, the first control assembly 260 a, and the first plasma-tuning slab 261 a can have a first x/y plane offset (x_(1a)) associated therewith, and the first x/y plane offset (x_(1a)) can be wavelength-dependent and can vary from about a quarter wavelength (λ/4) to about (10λ). The first control assembly 260 a can comprise dielectric material, can have a cylindrical configuration and a diameter (d_(1a)) that can vary from about 1 mm to about 5 mm.

A second plasma-tuning rod (270 b, 275 b) can comprise dielectric material and can have a second plasma-tuning portion 270 b that can extend a second plasma-tuning distance 271 b into the process space 215 at a second location defined using (x_(2b)). For example, the second plasma-tuning distance 271 b can vary from about 10 mm to about 400 mm.

A second EM-coupling region 262 b can be established at a second EM-coupling distance 276 b from the first cavity wall 265 a within the first EM energy tuning space 269 a established in the first cavity assembly 268 a, and the second EM-tuning portion 275 b can extend into the second EM-coupling region 262 b. The second EM-tuning portion 275 b can obtain second microwave energy from the second EM-coupling region 262 b, and the second microwave energy can be transferred to the process space 215 at the second location (x_(1b)) using the second plasma-tuning portion 270 b. The second EM-coupling region 262 b can include a maximum field region, a maximum voltage region, maximum energy region, or a maximum current region, or any combination thereof. For example, the second EM-coupling distance 276 b can vary from about 0.01 mm to about 10 mm, and the second EM-coupling distance 276 b can be wavelength-dependent and can vary from about (λ/4) to about (10λ).

A second plasma-tuning slab 261 b can comprise dielectric material, can be coupled to a second control assembly 260 b, and can be used to move 263 b the second plasma-tuning slab 261 b a second EM-tuning distance 277 b relative to the second EM-tuning portion 275 b of the second plasma-tuning rod (270 b, 275 b) within the first EM energy tuning space 269 a. The second control assembly 260 b and the second plasma-tuning slab 261 b can be used to optimize the microwave energy coupled from the second EM-coupling region 262 b to the second EM-tuning portion 275 b of the second plasma-tuning rod (270 b, 275 b). For example, the second EM-tuning distance 277 b can be established between the second EM-tuning portion 275 b and the second plasma-tuning slab 261 b within the first EM energy tuning space 269 a, and the second EM-tuning distance 277 b can vary from about 0.01 mm to about 1 mm.

The second plasma-tuning rod (270 b, 275 b) can have a second diameter (d_(1b)) associated therewith that can vary from about 0.01 mm to about 1 mm. The second plasma-tuning slab 261 b can have a second diameter (D_(1b)) associated therewith that can vary from about 1 mm to about 10 mm. The second EM-coupling region 262 b, the second control assembly 260 b, and the second plasma-tuning slab 261 b can have a second x/y plane offset (x_(1b)) associated therewith, and the second x/y plane offset (x_(1b)) can be wavelength-dependent and can vary from about a quarter wavelength (λ/4) to about (10λ). The second control assembly 260 b can comprise dielectric material, can have a cylindrical configuration and a diameter (d_(1b)) that can vary from about 1 mm to about 5 mm.

A third plasma-tuning rod (270 c, 275 c) can comprise dielectric material and can have a third plasma-tuning portion 270 c that can extend a third plasma-tuning distance 271 c into the process space 215 at a third location defined using (x_(2c)). For example, the third plasma-tuning distance 271 c can vary from about 10 mm to about 400 mm.

A third EM-coupling region 262 c can be established at a third EM-coupling distance 276 c from the first cavity wall 265 a within the first EM energy tuning space 269 a established in the first cavity assembly 268 a, and the third EM-tuning portion 275 c can extend into the third EM-coupling region 262 c. The third EM-tuning portion 275 c can obtain third microwave energy from the third EM-coupling region 262 c, and the third microwave energy can be transferred to the process space 215 at the third location (x₂) using the third plasma-tuning portion 270 c. The third EM-coupling region 262 c can include a maximum field region, a maximum voltage region, maximum energy region, or a maximum current region, or any combination thereof. For example, the third EM-coupling distance 276 c can vary from about 0.01 mm to about 10 mm, and the third EM-coupling distance 276 c can be wavelength-dependent and can vary from about (λ/4) to about (10λ).

A third plasma-tuning slab 261 c can comprise dielectric material, can be coupled to a third control assembly 260 c and can be used to move 263 c the third plasma-tuning slab 261 c a third EM-tuning distance 277 c relative to the third EM-tuning portion 275 c of the third plasma-tuning rod (270 c, 275 c) within the first EM energy tuning space 269 a. The third control assembly 260 c and the third plasma-tuning slab 261 c can be used to optimize the microwave energy coupled from the third EM-coupling region 262 c to the third EM-tuning portion 275 c of the third plasma-tuning rod (270 c, 275 c). For example, the third EM-tuning distance 277 c can be established between the third EM-tuning portion 275 c and the third plasma-tuning slab 261 c within the first EM energy tuning space 269 a, and the third EM-tuning distance 277 c can vary from about 0.01 mm to about 1 mm.

The third plasma-tuning rod (270 c, 275 c) can have a third diameter (d_(1c)) associated therewith that can vary from about 0.01 mm to about 1 mm. The third plasma-tuning slab 261 c can have a third diameter (D_(1g)) associated therewith that can vary from about 1 mm to about 10 mm. The third EM-coupling region 262 c, the third control assembly 260 c, and the third plasma-tuning slab 261 c can have a third x/y plane offset (x_(1c)) associated therewith, and the third x/y plane offset (x_(1c)) can be wavelength-dependent and can vary from about a quarter wavelength (λ/4) to about (10λ). The third control assembly 260 c can comprise dielectric material, can have a cylindrical configuration and a diameter (d₁) that can vary from about 1 mm to about 5 mm.

A fourth plasma-tuning rod (270 d, 275 d) can comprise dielectric material and can have a fourth plasma-tuning portion 270 d that can extend a fourth plasma-tuning distance 271 d into the process space 215 at a fourth location defined using (x_(2d)). For example, the fourth plasma-tuning distance 271 d can vary from about 10 mm to about 400 mm.

A fourth EM-coupling region 262 d can be established at a fourth EM-coupling distance 276 d from the first cavity wall 265 a within the first EM energy tuning space 269 a established in the first cavity assembly 268 a, and the fourth EM-tuning portion 275 d can extend into the fourth EM-coupling region 262 d. The fourth EM-tuning portion 275 d can obtain fourth microwave energy from the fourth EM-coupling region 262 d, and the fourth microwave energy can be transferred to the process space 215 at the fourth location (x_(2d)) using the fourth plasma-tuning portion 270 d. The fourth EM-coupling region 262 d can include a maximum field region, a maximum voltage region, maximum energy region, or a maximum current region, or any combination thereof. For example, the fourth EM-coupling distance 276 d can vary from about 0.01 mm to about 10 mm, and the fourth EM-coupling distance 276 d can be wavelength-dependent and can vary from about (λ/4) to about (10λ).

A fourth plasma-tuning slab 261 d can comprise dielectric material, can be coupled to a fourth control assembly 260 d, and can be used to move 263 d the fourth plasma-tuning slab 261 d a fourth EM-tuning distance 277 d relative to the fourth EM-tuning portion 275 d of the fourth plasma-tuning rod (270 d, 275 d) within the first EM energy tuning space 269 a. The fourth control assembly 260 d and the fourth plasma-tuning slab 261 d can be used to optimize the microwave energy coupled from the fourth EM-coupling region 262 d to the fourth EM-tuning portion 275 d of the fourth plasma-tuning rod (270 d, 275 d). For example, the fourth EM-tuning distance 277 d can be established between the fourth EM-tuning portion 275 d and the fourth plasma-tuning slab 261 d within the first EM energy tuning space 269 a, and the fourth EM-tuning distance 277 d can vary from about 0.01 mm to about 1 mm.

The fourth plasma-tuning rod (270 d, 275 d) can have a fourth diameter (d_(1d)) associated therewith, and the fourth diameter (d_(1d)) can vary from about 0.01 mm to about 1 mm. The fourth plasma-tuning slab 261 d can have a fourth diameter (D_(1d)) associated therewith, and the fourth diameter (D_(1d)) can vary from about 1 mm to about 10 mm. The fourth EM-coupling region 262 d, the fourth control assembly 260 d, and the fourth plasma-tuning slab 261 d can have a fourth x/y plane offset (x_(1d)) associated therewith, and the fourth x/y plane offset (x_(1d)) can be wavelength-dependent and can vary from about a quarter wavelength (λ/4) to about (10λ). The fourth control assembly 260 d can comprise dielectric material and can have a cylindrical configuration and a diameter (d_(1d)) that can vary from about 1 mm to about 5 mm.

A fifth plasma-tuning rod (270 e, 275 e) can comprise dielectric material and can have a fifth plasma-tuning portion 270 e that can extend a fifth plasma-tuning distance 271 e into the process space 215 at a fifth location defined using (x_(2e)). For example, the fifth plasma-tuning distance 271 e can vary from about 10 mm to about 400 mm.

A fifth EM-coupling region 262 e can be established at a fifth EM-coupling distance 276 e from the first cavity wall 265 b within the second EM energy tuning space 269 b established in the second cavity assembly 268 b, and the fifth EM-tuning portion 275 e can extend into the fifth EM-coupling region 262 e. The fifth EM-tuning portion 275 e can obtain fifth microwave energy from the fifth EM-coupling region 262 e, and the fifth microwave energy can be transferred to the process space 215 at the fifth location (x_(2e)) using the fifth plasma-tuning portion 270 e. The fifth EM-coupling region 262 e can include a maximum field region, a maximum voltage region, maximum energy region, or a maximum current region, or any combination thereof. For example, the fifth EM-coupling distance 276 e can vary from about 0.01 mm to about 10 mm, and the fifth EM-coupling distance 276 e can be wavelength-dependent and can vary from about (λ/4) to about (10λ).

A fifth plasma-tuning slab 261 e can comprise dielectric material, can be coupled to a fifth control assembly 260 e, and can be used to move 263 e the fifth plasma-tuning slab 261 e a fifth EM-tuning distance 277 e relative to the fifth EM-tuning portion 275 e of the fifth plasma-tuning rod (270 e, 275 e) within the first EM energy tuning space 269 a. The fifth control assembly 260 e and the fifth plasma-tuning slab 261 e can be used to optimize the microwave energy coupled from the fifth EM-coupling region 262 e to the fifth EM-tuning portion 275 e of the fifth plasma-tuning rod (270 e, 275 e). For example, the fifth EM-tuning distance 277 e can be established between the fifth EM-tuning portion 275 e and the fifth plasma-tuning slab 261 e within the second EM energy tuning space 269 b, and the fifth EM-tuning distance 277 e can vary from about 0.01 mm to about 1 mm.

The fifth plasma-tuning rod (270 e, 275 e) can have a fifth diameter (d_(1e)) associated therewith that can vary from about 0.01 mm to about 1 mm. The fifth plasma-tuning slab 261 e can have a fifth diameter (D_(1e)) associated therewith that can vary from about 1 mm to about 10 mm. The fifth EM-coupling region 262 e, the fifth control assembly 260 e, and the fifth plasma-tuning slab 261 e can have a fifth x/y plane offset (x_(1e)) associated therewith, and the fifth x/y plane offset (x_(1e)) can be wavelength-dependent and can vary from about a quarter wavelength (λ/4) to about (10λ). The fifth control assembly 260 e can comprise dielectric material, can have a cylindrical configuration and a diameter (d_(1e)) that can vary from about 1 mm to about 5 mm.

Still referring to FIG. 2A, a sixth plasma-tuning rod (270 f, 275 f) can comprise dielectric material and can have a sixth plasma-tuning portion 270 f that can extend a sixth plasma-tuning distance 271 f into the process space 215 at a sixth location defined using (x_(2f)). The sixth plasma-tuning distance 271 f can vary from about 10 mm to about 400 mm.

A sixth EM-coupling region 262 f can be established at a sixth EM-coupling distance 276 f from the first cavity wall 265 b within the second EM energy tuning space 269 b established in the second cavity assembly 268 b, and the sixth EM-tuning portion 275 f can extend into the sixth EM-coupling region 262 f. The sixth EM-tuning portion 275 f can obtain sixth microwave energy from the sixth EM-coupling region 262 f, and the sixth microwave energy can be transferred to the process space 215 at the sixth location (x_(2f)) using the sixth plasma-tuning portion 270 f. The sixth EM-coupling region 262 f can include a maximum field region, a maximum voltage region, maximum energy region, or a maximum current region, or any combination thereof. For example, the sixth EM-coupling distance 276 f can vary from about 0.01 mm to about 10 mm, and the sixth EM-coupling distance 276 f can be wavelength-dependent and can vary from about (λ/4) to about (10λ).

A sixth plasma-tuning slab 261 f can comprise dielectric material, can be coupled to a sixth control assembly 260 f, and can be used to move 263 f the sixth plasma-tuning slab 261 f a sixth EM-tuning distance 277 f relative to the sixth EM-tuning portion 275 f of the sixth plasma-tuning rod (270 f, 275 f) within the second EM energy tuning space 269 b. The sixth control assembly 260 f and the sixth plasma-tuning slab 261 f can be used to optimize the microwave energy coupled from the sixth EM-coupling region 262 f to the sixth EM-tuning portion 275 f of the sixth plasma-tuning rod (270 f, 275 f). For example, the sixth EM-tuning distance 277 f can be established between the sixth EM-tuning portion 275 f and the sixth plasma-tuning slab 261 f within the second EM energy tuning space 269 b, and the sixth EM-tuning distance 277 f can vary from about 0.01 mm to about 1 mm.

The sixth plasma-tuning rod (270 f, 275 f) can have a sixth diameter (d_(1f)) associated therewith that can vary from about 0.01 mm to about 1 mm. The sixth plasma-tuning slab 261 f can have a sixth diameter (D_(1f)) associated therewith that can vary from about 1 mm to about 10 mm. The sixth EM-coupling region 262 f, the sixth control assembly 260 f, and the sixth plasma-tuning slab 261 f can have a sixth x/y plane offset (x_(1f)) associated therewith, and the sixth x/y plane offset (x_(1f)) can be wavelength-dependent and can vary from about a quarter wavelength (λ/4) to about (10λ). The sixth control assembly 260 f can comprise dielectric material, can have a cylindrical configuration and a diameter (d_(1f)) that can vary from about 1 mm to about 5 mm.

A seventh plasma-tuning rod (270 g, 275 g) can comprise dielectric material and can have a seventh plasma-tuning portion 270 g that can extend a seventh plasma-tuning distance 271 g into the process space 215 at a seventh location defined using (x_(2g)). The seventh plasma-tuning distance 271 g can vary from about 10 mm to about 400 mm.

A seventh EM-coupling region 262 g can be established at a seventh EM-coupling distance 276 g from the first cavity wall 265 b within the second EM energy tuning space 269 b established in the second cavity assembly 268 b, and the seventh EM-tuning portion 275 g can extend into the seventh EM-coupling region 262 g. The seventh EM-tuning portion 275 g can obtain seventh microwave energy from the seventh EM-coupling region 262 g, and the seventh microwave energy can be transferred to the process space 215 at the seventh location (x_(2g)) using the seventh plasma-tuning portion 270 g. The seventh EM-coupling region 262 g can include a maximum field region, a maximum voltage region, maximum energy region, or a maximum current region, or any combination thereof. For example, the seventh EM-coupling distance 276 g can vary from about 0.01 mm to about 10 mm, and the seventh EM-coupling distance 276 g can be wavelength-dependent and can vary from about (λ/4) to about (10λ).

A seventh plasma-tuning slab 261 g can comprise dielectric material, can be coupled to a seventh control assembly 260 g, and can be used to move 263 g the seventh plasma-tuning slab 261 g a seventh EM-tuning distance 277 g relative to the seventh EM-tuning portion 275 g of the seventh plasma-tuning rod (270 g, 275 g) within the second EM energy tuning space 269 b. The seventh control assembly 260 g and the seventh plasma-tuning slab 261 g can be used to optimize the microwave energy coupled from the seventh EM-coupling region 262 g to the seventh EM-tuning portion 275 g of the seventh plasma-tuning rod (270 g, 275 g). For example, the seventh EM-tuning distance 277 g can be established between the seventh EM-tuning portion 275 g and the seventh plasma-tuning slab 261 g within the second EM energy tuning space 269 b, and the seventh EM-tuning distance 277 g can vary from about 0.01 mm to about 1 mm.

The seventh plasma-tuning rod (270 g, 275 g) can have a seventh diameter (d_(1g)) associated therewith that can vary from about 0.01 mm to about 1 mm. The seventh plasma-tuning slab 261 g can have a seventh diameter (D_(1g)) associated therewith that can vary from about 1 mm to about 10 mm. The seventh EM-coupling region 262 g, the seventh control assembly 260 g, and the seventh plasma-tuning slab 261 g can have a seventh x/y plane offset (x_(1g)) associated therewith, and the seventh x/y plane offset (x_(1g)) can be wavelength-dependent and can vary from about a quarter wavelength (λ/4) to about (10λ). The seventh control assembly 260 g can comprise dielectric material, can have a cylindrical configuration and a diameter (d_(1g)) that can vary from about 1 mm to about 5 mm.

An eighth plasma-tuning rod (270 h, 275 h) can comprise dielectric material and can have an eighth plasma-tuning portion 270 h that can extend an eighth plasma-tuning distance 271 h into the process space 215 at an eighth location defined using (x_(2h)). The eighth plasma-tuning distance 271 h can vary from about 10 mm to about 400 mm.

An eighth EM-coupling region 262 h can be established at an eighth EM-coupling distance 276 h from the first cavity wall 265 b within the second EM energy tuning space 269 b established in the second cavity assembly 268 b, and the eighth EM-tuning portion 275 h can extend into the eighth EM-coupling region 262 h. The eighth EM-tuning portion 275 h can obtain eighth microwave energy from the eighth EM-coupling region 262 h, and the eighth microwave energy can be transferred to the process space 215 at the eighth location (x_(2h)) using the eighth plasma-tuning portion 270 h. The eighth EM-coupling region 262 h can include a maximum field region, a maximum voltage region, maximum energy region, or a maximum current region, or any combination thereof. For example, the eighth EM-coupling distance 276 h can vary from about 0.01 mm to about 10 mm, and the eighth EM-coupling distance 276 h can be wavelength-dependent and can vary from about (λ/4) to about (10λ).

An eighth plasma-tuning slab 261 h can comprise dielectric material, can be coupled to an eighth control assembly 260 h, and can be used to move 263 h the eighth plasma-tuning slab 261 h an eighth EM-tuning distance 277 h relative to the eighth EM-tuning portion 275 h of the eighth plasma-tuning rod (270 h, 275 h) within the second EM energy tuning space 269 b. The eighth control assembly 260 h and the eighth plasma-tuning slab 261 h can be used to optimize the microwave energy coupled from the eighth EM-coupling region 262 h to the eighth EM-tuning portion 275 h of the eighth plasma-tuning rod (270 h, 275 h). For example, the eighth EM-tuning distance 277 h can be established between the eighth EM-tuning portion 275 h and the eighth plasma-tuning slab 261 h within the second EM energy tuning space 269 b, and the eighth EM-tuning distance 277 h can vary from about 0.01 mm to about 1 mm.

The eighth plasma-tuning rod (270 h, 275 h) can have an eighth diameter (d_(1h)) associated therewith that can vary from about 0.01 mm to about 1 mm. The eighth plasma-tuning slab 261 h can have an eighth diameter (D_(1h)) associated therewith that can vary from about 1 mm to about 10 mm. The eighth EM-coupling region 262 h, the eighth control assembly 260 h, and the eighth plasma-tuning slab 261 h can have an eighth x/y plane offset (x_(1h)) associated therewith, and the eighth x/y plane offset (x_(1h)) can be wavelength-dependent and can vary from about a quarter wavelength (λ/4) to about (10λ). The eighth control assembly 260 h can comprise dielectric material, can have a cylindrical configuration and a diameter (d_(1h)) that can vary from about 1 mm to about 5 mm.

The top view of the second microwave processing system 200 includes a top view of a first cavity-control assembly 245 a that is shown coupled to a top view of a first cavity-tuning slab 246 a. The first cavity-control assembly 245 a can have a first diameter (d_(1aa)) associated therewith, and the first diameter (d_(1aa)) can vary from about 0.01 mm to about 1 mm. The first cavity-tuning slab 246 a can have a second diameter (D_(laa)) associated therewith, and the second diameter (D_(1aa)) can vary from about 1 mm to about 10 mm. The first cavity-control assembly 245 a and the first cavity-tuning slab 246 a can have a first x/y plane offset (y_(1aa)) associated therewith, and the first x/y plane offset (y_(1aa)) can vary from about 1 mm to about 10 mm.

In addition, the top view of the second microwave processing system 200 includes a top view of a second cavity-control assembly 245 b that is shown coupled to a top view of a second cavity-tuning slab 246 b. The second cavity-control assembly 245 b can have a first additional diameter (d_(1ba)) associated therewith, and the first additional diameter (d_(1ba)) can vary from about 0.01 mm to about 1 mm. The second cavity-tuning slab 246 b can have a second additional diameter (D_(1ba)) associated therewith, and the second additional diameter (D_(1ba)) can vary from about 1 mm to about 10 mm. The second cavity-control assembly 245 b and the second cavity-tuning slab 246 b can have a second x/y plane offset (y_(1ba)) associated therewith, and the second x/y plane offset (y_(1ba)) vary from about 1 mm to about 10 mm.

FIG. 2B shows a partial cut-away front view of a second process chamber 210 in a second microwave processing system 200. The front view shows an x/z plane view of a plurality of additional walls 212 coupled to each other, thereby creating a partial cut-away front view of a process space 215 in the second process chamber 210. The second microwave processing system 200 can be configured to form uniform plasma in the process space 215.

The front view shows a cut-away view of a first cavity assembly 268 a having a first EM energy tuning space 269 a therein, and the first cavity assembly 268 a can include a first cavity wall 265 a, a second cavity wall 266 a, at least one third cavity wall 267 a, and one or more additional cavity walls (not shown). For example, and the first cavity assembly 268 a can be coupled to the first interface assembly 212 a using the first cavity wall 265 a. The front view also shows a cut-away view of a second cavity assembly 268 b having a second EM energy tuning space 269 b therein, and the second cavity assembly 268 b can include a first cavity wall 265 b, a second cavity wall 266 b, at least one third cavity wall 267 b, and one or more additional cavity walls (not shown). For example, and the second cavity assembly 268 b can be coupled to the second interface assembly 212 b using the first cavity wall 265 b.

A partial front view (dash line view) of a first set of plasma tuning rods (270 a-270 d), a partial front view (dash line view) of a first set of plasma-tuning slabs (261 a-261 d), a partial front view (dotted line view) of a second set of plasma tuning rods (270 e-270 h), and a partial front view (dotted line view) of a second set of plasma-tuning slabs (261 e-261 h) are shown in FIG. 2B.

The first set of plasma tuning rods (270 a-270 d) and the first set of plasma-tuning slabs (261 a-261 d) can have a first set of x/y plane offsets (x_(2a-d)) associated therewith, and the first set of x/y plane offsets (x_(2a-d)) can vary from about 10 mm to about 100 mm. The first set of plasma tuning rods (270 a-270 d) and the first set of plasma-tuning slabs (261 a-261 d) can have a first set of x/z plane offsets (z_(1a-d)) associated therewith, and the first set of x/z plane offsets (z_(1a-d)) can vary from about 100 mm to about 400 mm.

The second set of plasma tuning rods (270 e-270 h) and the second set of plasma-tuning slabs (261 e-261 h) can have a second set of x/y plane offsets (x_(2e-h)) associated therewith, and the second set of x/y plane offsets (x_(2e-h)) can vary from about 10 mm to about 100 mm. The second set of plasma tuning rods (270 e-270 h) and the second set of plasma-tuning slabs (261 e-261 h) can have a second set of x/z plane offsets (z_(1e-h)) associated therewith, and the second set of x/z plane offsets (z_(1e-h)) can vary from about 100 mm to about 400 mm.

FIG. 2B shows that the second microwave processing system 200 can include one or more plasma sensors 206 coupled to a chamber wall 212 to obtain first plasma data. In addition, the second microwave processing system 200 may be configured to process 200 mm substrates, 300 mm substrates, or larger-sized substrates. In addition, square and/or rectangular chambers can be configured so that the second microwave processing system 200 may be configured to process square or rectangular substrates, wafers, or LCDs regardless of their size, as would be appreciated by those skilled in the art. Therefore, while aspects of the invention will be described in connection with the processing of a semiconductor substrate, the invention is not limited solely thereto.

As shown in FIG. 2B, a first EM source 250 a can be coupled to a first cavity assembly 268 a, and a second EM source 250 b can be coupled to a second cavity assembly 268 b. The first EM source 250 a can be coupled to a first matching network 252 a, and the first matching network 252 a can be coupled to a first coupling network 254 a. The second EM source 250 b can be coupled to a second matching network 252 b, and the second matching network 252 b can be coupled to a second coupling network 254 b. Alternatively, a plurality of matching networks (not shown) or a plurality of coupling networks (not shown) may be used.

The first coupling network 254 a can be removably coupled to the first cavity assembly 268 a that can be removably coupled to an upper portion of a first interface assembly 212 a of the process chamber 210. The first coupling network 254 a can be used to provide microwave energy to the first EM energy tuning space 269 a in the first cavity assembly 268 a. The second coupling network 254 b can be removably coupled to the second cavity assembly 268 b that can be removably coupled to an upper portion of a second interface assembly 212 b of the process chamber 210. The second coupling network 254 b can be used to provide additional microwave energy to the second EM energy tuning space 269 b in the second cavity assembly 268 b. Alternatively, other EM-coupling configurations may be used.

As shown in FIG. 2B, a controller 295 can be coupled 296 to the EM sources (250 a, 250 b), the matching networks (252 a, 252 b), the coupling networks (254 a, 254 b), and the cavity assemblies (268 a, 268 b), and the controller 295 can use process recipes to establish, control, and optimize the EM sources (250 a, 250 b), the matching networks (252 a, 252 b), the coupling networks (254 a, 254 b), and the cavity assemblies (268 a, 268 b) to control the plasma uniformity within the process space 215. For example, the EM sources (250 a, 250 b) can operate at a frequency from about 500 MHz. to about 5000 MHz. In addition, the controller 295 can be coupled 296 to the plasma sensors 206 and process sensors 207, and the controller 295 can use process recipes to establish, control, and optimize the data from the plasma sensors 206 and the process sensors 207 to control the plasma uniformity within the process space 215.

In addition, the controller 295 can be coupled 296 to gas supply system 240, to a gas supply subassembly 241, and to a gas showerhead 243. For example, the gas supply system 240, the gas supply subassembly 241 and the gas showerhead 243 can be configured to introduce one or more process gases to process space 215, and can include flow control and/or flow measuring devices.

During dry plasma etching, the process gas may comprise an etchant, a passivant, or an inert gas, or a combination of two or more thereof. For example, when plasma etching a dielectric film such as silicon oxide (SiO_(x)) or silicon nitride (Si_(x)N_(y)), the plasma etch gas composition generally includes a fluorocarbon-based chemistry (C_(x)F_(y)) such as at least one of C₄F₈, C₅F₈, C₃F₆, C₄F₆, CF₄, etc., and/or may include a fluorohydrocarbon-based chemistry (C_(x)H_(y)F_(z)) such as at least one of CHF₃, CH₂F₂, etc., and can have at least one of an inert gas, oxygen, CO or CO₂. Additionally, for example, when etching polycrystalline silicon (polysilicon), the plasma etch gas composition generally includes a halogen-containing gas such as HBr, Cl₂, NF₃, or SF₆ or a combination of two or more thereof, and may include fluorohydrocarbon-based chemistry (C_(x)H_(y)F_(z)) such as at least one of CHF₃, CH₂F₂, etc., and at least one of an inert gas, oxygen, CO or CO₂, or two or more thereof. During plasma enhanced deposition, the process gas may comprise a film forming precursor, a reduction gas, or an inert gas, or a combination of two or more thereof.

As shown in FIG. 2B, the second microwave processing system 200 can include a pressure control system 290 and port 291 coupled to the process chamber 210, and configured to evacuate the process chamber 210, as well as control the pressure within the process chamber 210. In addition, the second microwave processing system 200 can include a movable substrate holder 220 for processing substrate 205.

The front view of the second microwave processing system 200 includes a partial front view of a first cavity-control assembly 245 a that is shown coupled to a front view of a first cavity-tuning slab 246 a. The first cavity-control assembly 245 a and the first cavity-tuning slab 246 a can have a first x/z plane offset (z_(1aa)) associated therewith, and the first x/z plane offset (z_(1aa)) can vary from about 1 mm to about 10 mm.

The first cavity-control assembly 245 a can be used to move 247 a the first cavity-tuning slab 246 a cavity-tuning distances 248 a within the first EM-energy tuning space 269 a. The controller 295 can be coupled 296 to the cavity-control assembly 245 a, and the controller 295 can use process recipes to establish, control, and optimize the cavity-tuning distances 248 a to control and maintain the plasma uniformity within the process space 215 in real-time. For example, the cavity-tuning distances 248 a can vary from about 0.01 mm to about 10 mm, and the cavity-tuning distances 248 a can be wavelength-dependent and can vary from about (λ/4) to about (10λ).

In addition, the front view of the second microwave processing system 200 includes a partial front view of a second cavity-control assembly 245 b that is shown coupled to a front view of a second cavity-tuning slab 246 b. The second cavity-control assembly 245 b and the second cavity-tuning slab 246 b can have a second x/z plane offset (z_(1ba)) associated therewith that can vary from about 1 mm to about 10 mm.

The second cavity-control assembly 245 b can be used to move 247 b the second cavity-tuning slab 246 b second cavity-tuning distances 248 b within the second EM-energy tuning space 269 b. The controller 295 can be coupled 296 to the second cavity-control assembly 245 b, and the controller 295 can use process recipes to establish, control, and optimize the second cavity-tuning distances 248 b to control and maintain the plasma uniformity within the process space 215 in real-time. For example, the second cavity-tuning distances 248 b can vary from about 0.01 mm to about 10 mm, and the second cavity-tuning distances 248 b can be wavelength-dependent and can vary from about (λ/4) to about (10λ).

FIG. 2C shows a partial cut-away side view of the second process chamber 210 in the second microwave processing system 200. The side view shows a y/z plane view of a plurality of chamber walls 212 coupled to a first interface assembly 212 a and to a second interface assembly 212 b, thereby creating a partial cut-away side view of the process space 215 in the process chamber 210. The second microwave processing system 200 can be configured to form plasma in the process space 215.

A partial side view of a first EM energy tuning space 269 a in the first cavity assembly 268 a and a partial side view of a second EM energy tuning space 269 b in the second cavity assembly 268 b are shown in FIG. 2C. A partial side view of the first set of plasma tuning rods (270 a-270 d), a partial side view of a first set of plasma-tuning slabs (261 a-261 d), a partial side view of a second set of plasma tuning rods (270 e-270 h), and a partial side view of a second set of plasma-tuning slabs (261 e-261 h) are shown in FIG. 2C.

Side views of a first set of isolation assemblies (264 a, 264 b, 264 c, and 264 d) and a second set of isolation assemblies (264 e, 264 f, 264 g, and 264 h) are also shown in FIG. 2C. For example, first set of isolation assemblies (264 a, 264 b, 264 c, and 264 d) can be used to removably couple the first set of plasma tuning rods {(270 a, 270 b, 270 c, and 270 d) and (275 a, 275 b, 275 c, and 275 d)} to a first interface assembly 212 a. Each of the first set of isolation assemblies (264 a, 264 b, 264 c, and 264 d) can be removably coupled to a first interface assembly 212 a. In addition, the second set of isolation assemblies (264 e, 264 f, 264 g, and 264 h) can be used to removably couple the second set of plasma tuning rods {(270 e, 270 f, 270 g, and 270 h) and (275 e, 275 f, 275 g, and 275 h)} to a second interface assembly 212 b. Each of the second set of isolation assemblies (264 e, 264 f, 264 g, and 264 h) can be removably coupled to a second interface assembly 212 b.

As shown in FIG. 2C, a first set of plasma-tuning slabs (261 a, 261 b, 261 c, and 261 d) can be coupled to a first set of control assemblies (260 a, 260 b, 260 c, and 260 d), and first set of control assemblies (260 a, 260 b, 260 c, and 260 d) can be used to move (263 a, 263 b, 263 c, and 263 d) the first set of plasma-tuning slabs (261 a, 261 b, 261 c, and 261 d) the first set of EM-tuning distances (277 a, 277 b, 277 c, and 277 d) relative to the EM-tuning portions (275 a, 275 b, 275 c, and 275 d) within the first EM energy tuning space 269 a. In addition, a second set of plasma-tuning slabs (261 e, 261 f, 261 g, and 261 h) can be coupled to a second set of control assemblies (260 e, 260 f, 260 g, and 260 h), and the second set of control assemblies (260 e, 260 f, 260 g, and 260 h) can be used to move (263 e, 263 f, 263 g, and 263 h) the second set of plasma-tuning slabs (261 e, 261 f, 261 g, and 261 h) the second set of EM-tuning distances (277 e, 277 f, 277 g, and 277 h) relative to the EM-tuning portions (275 e, 275 f, 275 g, and 275 h) within the second EM energy tuning space 269 b.

The first set of control assemblies (260 a, 260 b, 260 c, and 260 d) can be coupled 296 to the controller 295, and the controller 295 can use process recipes to establish, control, and optimize the first set of EM-tuning distances (277 a, 277 b, 277 c, and 277 d) to control the plasma uniformity within the process space 215. In addition, the second set of control assemblies (260 e, 260 f, 260 g, and 260 h) can be coupled 296 to the controller 295, and the controller 295 can use process recipes to establish, control, and optimize the second set of EM-tuning distances (277 e, 277 f, 277 g, and 277 h) to control the plasma uniformity within the process space 215.

The controller 295 can be coupled 296 to the EM sources (250 a, 250 b), the matching networks (252 a, 252 b), the coupling networks (254 a, 254 b), and the cavity assemblies (268 a, 268 b), and the controller 295 can use process recipes to establish, control, and optimize the EM sources (250 a, 250 b), the matching networks (252 a, 252 b), the coupling networks (254 a, 254 b), and the cavity assemblies (268 a, 268 b) to control the plasma uniformity within the process space 215. For example, the EM sources (250 a, 250 b) can operate at frequencies from about 500 MHz to about 5000 MHz. In addition, the controller 295 can be coupled 296 to the plasma sensors 206, the process sensors 207, and the cavity sensors (208 a and 208 b), and the controller 295 can use process recipes to establish, control, and optimize the data from the plasma sensors 206, the process sensors 207, and the cavity sensors (208 a and 208 b), to control the plasma uniformity in the process space 215.

The side view illustrates a process chamber 210 having a total width (y_(T)), and a total height (z_(T)) associated therewith in the y/z plane. For example, the total width (y_(T)) can vary from about 50 mm to about 500 mm, and the total height (z_(T)) can vary from about 50 mm to about 500 mm.

FIG. 3A shows a partial cut-away top view of a third process chamber 310 in a third microwave processing system 300. The top view shows an x/y plane view of a first interface assembly 312 a, a second interface assembly 312 b, and a plurality of additional chamber walls 312 coupled to the first interface assembly 312 a and the second interface assembly 312 b thereby forming the third process chamber 310. For example, the chamber walls 312 can have wall thicknesses (t) associated therewith, and the wall thicknesses (t) can vary from about 1 mm to about 5 mm. The first interface assembly 312 a can have a first interface thickness (t_(i1)) associated therewith, and the first interface thickness (t_(i1)) can vary from about 1 mm to about 10 mm. The second interface assembly 312 b can have a second interface thickness (t_(i2)) associated therewith, and the second interface thickness (t_(i2)) can vary from about 1 mm to about 10 mm. The process space 315 can have a length (x_(T)) associated therewith, and the length (x_(T)) can vary from about 10 mm to about 500 mm.

The top view of the third microwave processing system 300 shows a cut-away view of a first cavity assembly 368 a having a first EM energy tuning space 369 a therein, and the first cavity assembly 368 a can include a first cavity wall 365 a, a second cavity wall 366 a, at least one third cavity wall 367 a, and one or more additional cavity walls (not shown). For example, and the first cavity assembly 368 a can be coupled to the first interface assembly 312 a using the first cavity wall 365 a, and walls (365 a, 366 a, and 367 a) can comprise dielectric material and can have wall thicknesses (t_(a)) associated therewith, and the wall thicknesses (t_(a)) can vary from about 1 mm to about 5 mm. In addition, the first EM energy tuning space 369 a can have a first length (x_(T1a)) and a first width (y_(1a)) associated therewith, the first length (x_(T1a)) can vary from about 10 mm to about 500 mm, and the first width (y_(1a)) can vary from about 5 mm to about 50 mm.

The top view of the third microwave processing system 300 also shows a cut-away view of a second cavity assembly 368 b having a second EM energy tuning space 369 b therein, and the second cavity assembly 368 b can include a first cavity wall 365 b, a second cavity wall 366 b, at least one third cavity wall 367 b, and one or more additional cavity walls (not shown). For example, and the second cavity assembly 368 b can be coupled to the second interface assembly 312 b using the first cavity wall 365 b, and walls (365 b, 366 b, and 367 b) can comprise dielectric material and can have wall thicknesses (t_(b)) associated therewith, and the wall thicknesses (t_(b)) can vary from about 1 mm to about 5 mm. In addition, the second EM energy tuning space 369 b can have a second length (x_(T1b)) and a second width (y_(1b)) associated therewith, the second length (x_(T1b)) can vary from about 10 mm to about 500 mm, and the second width (y_(1b)) can vary from about 5 mm to about 50 mm.

In some exemplary systems, a first set of isolation assemblies (364 a, 364 b, and 364 c,) can be removably coupled to a first interface assembly 312 a and can be configured to isolate the process space 315 from the first EM energy tuning space 369 a. The first set of isolation assemblies (364 a, 364 b, and 364 c) can be used to removably couple the first set of plasma tuning rods {(370 a, 370 b, and 370 c) and (375 a, 375 b, and 375 c)} to a first interface assembly 312 a. For example, the first set of plasma-tuning portions (370 a, 370 b, and 370 c) can be configured in the process space 315, and the first set of EM-tuning portion (375 a, 375 b, and 375 c) can be configured within the first EM energy tuning space 369 a.

A second set of isolation assemblies (364 d, 364 e, and 3640 can be removably coupled to the second interface assembly 312 b and can be configured to isolate the process space 315 from the second EM energy tuning space 369 b. The second set of isolation assemblies (364 d, 364 e, and 3640 can be used to removably couple the second set of plasma tuning rods {(370 d, 370 e, and 3700 and (375 d, 375 e, and 3750} to the second interface assembly 312 b. For example, the second set of plasma-tuning portions (370 d, 370 e, and 3700 can be configured in the process space 315, and the second set of EM-tuning portion (375 d, 375 e, and 3750 can be configured within the second EM energy tuning space 369 b.

Still referring to FIG. 3A, a first plasma-tuning rod (370 a, 375 a) can comprise dielectric material and can have a first plasma-tuning portion 370 a that can extend a first plasma-tuning distance 371 a into the process space 315 at a first location defined using (x_(2a)). The first plasma-tuning distance 371 a can vary from about 10 mm to about 400 mm.

A first EM-coupling region 362 a can be established at a first EM-coupling distance 376 a from the first cavity wall 365 a within the first EM energy tuning space 369 a established in the first cavity assembly 368 a, and the first EM-tuning portion 375 a can extend into the first EM-coupling region 362 a. The first EM-tuning portion 375 a can obtain first microwave energy from the first EM-coupling region 362 a, and the first microwave energy can be transferred to the process space 315 at the first location (x_(2a)) using the first plasma-tuning portion 370 a. The first EM-coupling region 362 a can include a maximum field region, a maximum voltage region, maximum energy region, or a maximum current region, or any combination thereof. For example, the first EM-coupling distance 376 a can vary from about 0.01 mm to about 10 mm, and the first EM-coupling distance 376 a can be wavelength-dependent and can vary from about (λ/4) to about (10λ).

A first plasma-tuning slab 361 a can comprise dielectric material, can be coupled to a first control assembly 360 a, and can be used to move 363 a the first plasma-tuning slab 361 a a first EM-tuning distance 377 a relative to the first EM-tuning portion 375 a of the first plasma-tuning rod (370 a, 375 a) within the first EM energy tuning space 369 a. The first control assembly 360 a and the first plasma-tuning slab 361 a can be used to optimize the microwave energy coupled from the first EM-coupling region 362 a to the first EM-tuning portion 375 a of the first plasma-tuning rod (370 a, 375 a). For example, the first EM-tuning distance 377 a can be established between the first EM-tuning portion 375 a and the first plasma-tuning slab 361 a within the first EM energy tuning space 369 a, and the first EM-tuning distance 377 a can vary from about 0.01 mm to about 1 mm.

The first plasma-tuning rod (370 a, 375 a) can have a first diameter (d_(1a)) associated therewith that can vary from about 0.01 mm to about 1 mm. The first plasma-tuning slab 361 a can have a first diameter (D_(1a)) associated therewith that can vary from about 1 mm to about 10 mm. The first EM-coupling region 362 a, the first control assembly 360 a, and the first plasma-tuning slab 361 a can have a first x/y plane offset (x_(1a)) associated therewith, and the first x/y plane offset (x_(1a)) can be wavelength-dependent and can vary from about a quarter wavelength (λ/4) to about (10λ). The first control assembly 360 a can comprise dielectric material, can have a cylindrical configuration and a diameter (d_(1a)) that can vary from about 1 mm to about 5 mm.

A second plasma-tuning rod (370 b, 375 b) can have a second plasma-tuning portion 370 b that can extend a second plasma-tuning distance 371 b into the process space 315 at a second location defined using (x_(2b)). For example, the second plasma-tuning distance 371 b can vary from about 10 mm to about 400 mm.

A second EM-coupling region 362 b can be established at a second EM-coupling distance 376 b from the first cavity wall 365 a within the first EM energy tuning space 369 a established in the first cavity assembly 368 a, and the second EM-tuning portion 375 b can extend into the second EM-coupling region 362 b. The second EM-tuning portion 375 b can obtain second microwave energy from the second EM-coupling region 362 b, and the second microwave energy can be transferred to the process space 315 at the second location (x_(1b)) using the second plasma-tuning portion 370 b. The second EM-coupling region 362 b can include a maximum field region, a maximum voltage region, maximum energy region, or a maximum current region, or any combination thereof. For example, the second EM-coupling distance 376 b can vary from about 0.01 mm to about 10 mm, and the second EM-coupling distance 376 b can be wavelength-dependent and can vary from about (λ/4) to about (10λ).

A second plasma-tuning slab 361 b can comprise dielectric material, can be coupled to a second control assembly 360 b, and can be used to move 363 b the second plasma-tuning slab 361 b a second EM-tuning distance 377 b relative to the second EM-tuning portion 375 b of the second plasma-tuning rod (370 b, 375 b) within the first EM energy tuning space 369 a. The second control assembly 360 b and the second plasma-tuning slab 361 b can be used to optimize the microwave energy coupled from the second EM-coupling region 362 b to the second EM-tuning portion 375 b of the second plasma-tuning rod (370 b, 375 b). For example, the second EM-tuning distance 377 b can be established between the second EM-tuning portion 375 b and the second plasma-tuning slab 361 b within the first EM energy tuning space 369 a, and the second EM-tuning distance 377 b can vary from about 0.01 mm to about 1 mm.

The second plasma-tuning rod (370 b, 375 b) can have a second diameter (d_(1b)) associated therewith that can vary from about 0.01 mm to about 1 mm. The second plasma-tuning slab 361 b can have a second diameter (D_(1b)) associated therewith that can vary from about 1 mm to about 10 mm. The second EM-coupling region 362 b, the second control assembly 360 b, and the second plasma-tuning slab 361 b can have a second x/y plane offset (x_(1b)) associated therewith, and the second x/y plane offset (x_(1b)) can be wavelength-dependent and can vary from about a quarter wavelength (λ/4) to about (10λ). The second control assembly 360 b can comprise dielectric material, can have a cylindrical configuration and a diameter (d_(1b)) that can vary from about 1 mm to about 5 mm.

A third plasma-tuning rod (370 c, 375 c) can comprise dielectric material and can have a third plasma-tuning portion 370 c that can extend a third plasma-tuning distance 371 c into the process space 315 at a third location defined using (x_(2c)). For example, the third plasma-tuning distance 371 c can vary from about 10 mm to about 400 mm.

A third EM-coupling region 362 c can be established at a third EM-coupling distance 376 c from the first cavity wall 365 a within the first EM energy tuning space 369 a established in the first cavity assembly 368 a, and the third EM-tuning portion 375 c can extend into the third EM-coupling region 362 c. The third EM-tuning portion 375 c can obtain third microwave energy from the third EM-coupling region 362 c, and the third microwave energy can be transferred to the process space 315 at the third location (x₂) using the third plasma-tuning portion 370 c. The third EM-coupling region 362 c can include a maximum field region, a maximum voltage region, maximum energy region, or a maximum current region, or any combination thereof. The third EM-coupling distance 376 c can vary from about 0.01 mm to about 10 mm, and the third EM-coupling distance 376 c can be wavelength-dependent and can vary from about (λ/4) to about (10λ).

A third plasma-tuning slab 361 c can comprise dielectric material, can be coupled to a third control assembly 360 c, and can be used to move 363 c the third plasma-tuning slab 361 c a third EM-tuning distance 377 c relative to the third EM-tuning portion 375 c of the third plasma-tuning rod (370 c, 375 c) within the first EM energy tuning space 369 a. The third control assembly 360 c and the third plasma-tuning slab 361 c can be used to optimize the microwave energy coupled from the third EM-coupling region 362 c to the third EM-tuning portion 375 c of the third plasma-tuning rod (370 c, 375 c). For example, the third EM-tuning distance 377 c can be established between the third EM-tuning portion 375 c and the third plasma-tuning slab 361 c within the first EM energy tuning space 369 a, and the third EM-tuning distance 377 c can vary from about 0.01 mm to about 1 mm.

The third plasma-tuning rod (370 c, 375 c) can have a third diameter (d_(1c)) associated therewith that can vary from about 0.01 mm to about 1 mm. The third plasma-tuning slab 361 c can have a third diameter (D_(1c)) associated therewith that can vary from about 1 mm to about 10 mm. The third EM-coupling region 362 c, the third control assembly 360 c, and the third plasma-tuning slab 361 c can have a third x/y plane offset (x_(1c)) associated therewith, and the third x/y plane offset (x_(1c)) can be wavelength-dependent and can vary from about a quarter wavelength (λ/4) to about (10λ). For example, the third control assembly 360 c can have a cylindrical configuration and a diameter (d_(1c)) that can vary from about 1 mm to about 5 mm.

A fourth plasma-tuning rod (370 d, 375 d) can comprise dielectric material and can have a fourth plasma-tuning portion 370 d that can extend a fourth plasma-tuning distance 371 d into the process space 315 at a fourth location defined using (x_(2d)). For example, the fourth plasma-tuning distance 371 d can vary from about 10 mm to about 400 mm.

A fourth EM-coupling region 362 d can be established at a fourth EM-coupling distance 376 d from the first cavity wall 365 b within the second EM energy tuning space 369 b established in the second cavity assembly 368 b, and the fourth EM-tuning portion 375 d can extend into the fourth EM-coupling region 362 d. The fourth EM-tuning portion 375 d can obtain fourth microwave energy from the fourth EM-coupling region 362 d, and the fourth microwave energy can be transferred to the process space 315 at the fourth location (x_(2d)) using the fourth plasma-tuning portion 370 d. The fourth EM-coupling region 362 d can include a maximum field region, a maximum voltage region, maximum energy region, or a maximum current region, or any combination thereof. For example, the fourth EM-coupling distance 376 d can vary from about 0.01 mm to about 10 mm, and the fourth EM-coupling distance 376 d can be wavelength-dependent and can vary from about (λ/4) to about (10λ).

A fourth plasma-tuning slab 361 d can comprise dielectric material, can be coupled to a fourth control assembly 360 d, and can be used to move 363 d the fourth plasma-tuning slab 361 d a fourth EM-tuning distance 377 d relative to the fourth EM-tuning portion 375 d of the fourth plasma-tuning rod (370 d, 375 d) within the second EM energy tuning space 369 b. The fourth control assembly 360 d and the fourth plasma-tuning slab 361 d can be used to optimize the microwave energy coupled from the fourth EM-coupling region 362 d to the fourth EM-tuning portion 375 d of the fourth plasma-tuning rod (370 d, 375 d). For example, the fourth EM-tuning distance 377 d can be established between the fourth EM-tuning portion 375 d and the fourth plasma-tuning slab 361 d within the second EM energy tuning space 369 b, and the fourth EM-tuning distance 377 d can vary from about 0.01 mm to about 1 mm.

The fourth plasma-tuning rod (370 d, 375 d) can have a fourth diameter (d_(1d)) associated therewith that can vary from about 0.01 mm to about 1 mm. The fourth plasma-tuning slab 361 d can have a fourth diameter (D_(1d)) associated therewith that can vary from about 1 mm to about 10 mm. The fourth EM-coupling region 362 d, the fourth control assembly 360 d, and the fourth plasma-tuning slab 361 d can have a fourth x/y plane offset (x_(1d)) associated therewith, and the fourth x/y plane offset (x_(1d)) can be wavelength-dependent and can vary from about a quarter wavelength (λ/4) to about (10λ). The fourth control assembly 360 d can comprise dielectric material, can have a cylindrical configuration and a diameter (d_(1d)) that can vary from about 1 mm to about 5 mm.

A fifth plasma-tuning rod (370 e, 375 e) can comprise dielectric material and can have a fifth plasma-tuning portion 370 e that can extend a fifth plasma-tuning distance 371 e into the process space 315 at a fifth location defined using (x_(2e)). For example, the fifth plasma-tuning distance 371 e can vary from about 10 mm to about 400 mm.

A fifth EM-coupling region 362 e can be established at a fifth EM-coupling distance 376 e from the first cavity wall 365 b within the second EM energy tuning space 369 b established in the second cavity assembly 368 b, and the fifth EM-tuning portion 375 e can extend into the fifth EM-coupling region 362 e. The fifth EM-tuning portion 375 e can obtain fifth microwave energy from the fifth EM-coupling region 362 e, and the fifth microwave energy can be transferred to the process space 315 at the fifth location (x_(2e)) using the fifth plasma-tuning portion 370 e. The fifth EM-coupling region 362 e can include a maximum field region, a maximum voltage region, maximum energy region, or a maximum current region, or any combination thereof. For example, the fifth EM-coupling distance 376 e can vary from about 0.01 mm to about 10 mm, and the fifth EM-coupling distance 376 e can be wavelength-dependent and can vary from about (λ/4) to about (10λ).

A fifth plasma-tuning slab 361 e can comprise dielectric material, can be coupled to a fifth control assembly 360 e, and can be used to move 363 e the fifth plasma-tuning slab 361 e a fifth EM-tuning distance 377 e relative to the fifth EM-tuning portion 375 e of the fifth plasma-tuning rod (370 e, 375 e) within the first EM energy tuning space 369 a. The fifth control assembly 360 e and the fifth plasma-tuning slab 361 e can be used to optimize the microwave energy coupled from the fifth EM-coupling region 362 e to the fifth EM-tuning portion 375 e of the fifth plasma-tuning rod (370 e, 375 e). For example, the fifth EM-tuning distance 377 e can be established between the fifth EM-tuning portion 375 e and the fifth plasma-tuning slab 361 e within the second EM energy tuning space 369 b, and the fifth EM-tuning distance 377 e can vary from about 0.01 mm to about 1 mm.

The fifth plasma-tuning rod (370 e, 375 e) can have a fifth diameter (d_(1e)) associated therewith that can vary from about 0.01 mm to about 1 mm. The fifth plasma-tuning slab 361 e can have a fifth diameter (D_(1e)) associated therewith that can vary from about 1 mm to about 10 mm. The fifth EM-coupling region 362 e, the fifth control assembly 360 e, and the fifth plasma-tuning slab 361 e can have a fifth x/y plane offset (x_(1e)) associated therewith, and the fifth x/y plane offset (x_(1e)) can be wavelength-dependent and can vary from about a quarter wavelength (λ/4) to about (10λ). The fifth control assembly 360 e can comprise dielectric material, can have a cylindrical configuration and a diameter (d_(1e)) that can vary from about 1 mm to about 5 mm.

Still referring to FIG. 3A, a sixth plasma-tuning rod (370 f, 375 f) can comprise dielectric material and can have a sixth plasma-tuning portion 370 f that can extend a sixth plasma-tuning distance 371 f into the process space 315 at a sixth location defined using (x_(2f)). The sixth plasma-tuning distance 371 f can vary from about 10 mm to about 400 mm.

A sixth EM-coupling region 362 f can be established at a sixth EM-coupling distance 376 f from the first cavity wall 365 b within the second EM energy tuning space 369 b established in the second cavity assembly 368 b, and the sixth EM-tuning portion 375 f can extend into the sixth EM-coupling region 362 f. The sixth EM-tuning portion 375 f can obtain sixth microwave energy from the sixth EM-coupling region 362 f, and the sixth microwave energy can be transferred to the process space 315 at the sixth location (x_(2f)) using the sixth plasma-tuning portion 370 f. The sixth EM-coupling region 362 f can include a maximum field region, a maximum voltage region, maximum energy region, or a maximum current region, or any combination thereof. For example, the sixth EM-coupling distance 376 f can vary from about 0.01 mm to about 10 mm, and the sixth EM-coupling distance 376 f can be wavelength-dependent and can vary from about (λ/4) to about (10λ).

A sixth plasma-tuning slab 361 f can comprise dielectric material and can be coupled to a sixth control assembly 360 f and can be used to move 363 f the sixth plasma-tuning slab 361 f a sixth EM-tuning distance 377 f relative to the sixth EM-tuning portion 375 f of the sixth plasma-tuning rod (370 f, 375 f) within the second EM energy tuning space 369 b. The sixth control assembly 360 f and the sixth plasma-tuning slab 361 f can be used to optimize the microwave energy coupled from the sixth EM-coupling region 362 f to the sixth EM-tuning portion 375 f of the sixth plasma-tuning rod (370 f, 375 f). For example, the sixth EM-tuning distance 377 f can be established between the sixth EM-tuning portion 375 f and the sixth plasma-tuning slab 361 f within the second EM energy tuning space 369 b, and the sixth EM-tuning distance 377 f can vary from about 0.01 mm to about 1 mm.

The sixth plasma-tuning rod (370 f, 375 f) can have a sixth diameter (d_(1f)) associated therewith that can vary from about 0.01 mm to about 1 mm. The sixth plasma-tuning slab 361 f can have a sixth diameter (D_(1f)) associated therewith that can vary from about 1 mm to about 10 mm. The sixth EM-coupling region 362 f, the sixth control assembly 360 f, and the sixth plasma-tuning slab 361 f can have a sixth x/y plane offset (x_(1f)) associated therewith, and the sixth x/y plane offset (x_(1f)) can be wavelength-dependent and can vary from about a quarter wavelength (λ/4) to about (10λ). The sixth control assembly 360 f can comprise dielectric material, can have a cylindrical configuration and a diameter (d_(1f)) that can vary from about 1 mm to about 5 mm.

The top view of the third microwave processing system 300 includes a top view of a first cavity-control assembly 345 a that is shown coupled to a top view of a first cavity-tuning slab 346 a. The first cavity-control assembly 345 a can have a first diameter (D_(1aa)) associated therewith, and the first diameter (d_(1aa)) can vary from about 0.01 mm to about 1 mm. The first cavity-tuning slab 346 a can have a second diameter (D_(1aa)) associated therewith, and the second diameter (D_(1aa)) can vary from about 1 mm to about 10 mm. The first cavity-control assembly 345 a and the first cavity-tuning slab 346 a can have a first x/y plane offset (y_(1aa)) associated therewith, and the first x/y plane offset (y_(1aa)) can vary from about 1 mm to about 10 mm.

In addition, the top view of the third microwave processing system 300 includes a top view of a second cavity-control assembly 345 b that is shown coupled to a top view of a second cavity-tuning slab 346 b. The second cavity-control assembly 345 b can have a first additional diameter (d_(1ba)) associated therewith, and the first additional diameter (d_(1ba)) can vary from about 0.01 mm to about 1 mm. The second cavity-tuning slab 346 b can have a second additional diameter (D_(1ba)) associated therewith, and the second additional diameter (D_(1ba)) can vary from about 1 mm to about 10 mm. The second cavity-control assembly 345 b and the second cavity-tuning slab 346 b can have a second x/y plane offset (y_(1ba)) associated therewith, and the second x/y plane offset (y_(1ba)) vary from about 1 mm to about 10 mm.

FIG. 3B shows a partial cut-away front view of a third process chamber 310 in a third microwave processing system 300. The front view shows an x/z plane view of a plurality of additional walls 312 coupled to each other, thereby creating a partial cut-away front view of a process space 315 in the third process chamber 310. The third microwave processing system 300 can be configured to form uniform plasma in the process space 315.

The front view shows a cut-away view of a first cavity assembly 368 a having a first EM energy tuning space 369 a therein, and the first cavity assembly 368 a can include a first cavity wall 365 a, a second cavity wall 366 a, at least one third cavity wall 367 a, and one or more additional cavity walls (not shown). For example, and the first cavity assembly 368 a can be coupled to the first interface assembly 312 a using the first cavity wall 365 a. The front view also shows a cut-away view of a second cavity assembly 368 b having a second EM energy tuning space 369 b therein, and the second cavity assembly 368 b can include a first cavity wall 365 b, a second cavity wall 366 b, at least one third cavity wall 367 b, and one or more additional cavity walls (not shown). For example, and the second cavity assembly 368 b can be coupled to the second interface assembly 312 b using the first cavity wall 365 b.

A partial front view (dash line view) of a first set of plasma tuning rods (370 a-370 c), a partial front view (dash line view) of a first set of plasma-tuning slabs (361 a-361 c), a partial front view (dotted line view) of a second set of plasma tuning rods (370 d-370 f), and a partial front view (dotted line view) of a second set of plasma-tuning slabs (361 d-361 f) are shown in FIG. 3B.

The first set of plasma tuning rods (370 a-370 c) and the first set of plasma-tuning slabs (361 a-361 c) can have a first set of x/y plane offsets (x_(2a-c)) associated therewith, and the first set of x/y plane offsets (x_(2a-c)) can vary from about 10 mm to about 100 mm. The first set of plasma tuning rods (370 a-370 c) and the first set of plasma-tuning slabs (361 a-361 c) can have a first set of x/z plane offsets (z_(1a-c)) associated therewith, and the first set of x/z plane offsets (z_(1a-c)) can vary from about 100 mm to about 400 mm.

The second set of plasma tuning rods (370 d-370 f) and the second set of plasma-tuning slabs (361 d-361 f) can have a second set of x/y plane offsets (x_(2d-f)) associated therewith, and the second set of x/y plane offsets (x_(2d-f)) can vary from about 10 mm to about 100 mm. The second set of plasma tuning rods (370 d-370 f) and the second set of plasma-tuning slabs (361 d-361 f) can have a second set of x/z plane offsets (z_(1d-f)) associated therewith that can vary from about 100 mm to about 400 mm.

FIG. 3B shows that the third microwave processing system 300 can include one or more plasma sensors 306 coupled to a chamber wall 312 to obtain first plasma data. In addition, the third microwave processing system 300 may be configured to process 300 mm substrates, 300 mm substrates, or larger-sized substrates. In addition, square and/or rectangular chambers can be configured so that the third microwave processing system 300 may be configured to process square or rectangular substrates, wafers, or LCDs regardless of their size, as would be appreciated by those skilled in the art. Therefore, while aspects of the invention will be described in connection with the processing of a semiconductor substrate, the invention is not limited solely thereto.

As shown in FIG. 3B, a first EM source 350 a can be coupled to a first cavity assembly 368 a, and a second EM source 350 b can be coupled to a second cavity assembly 368 b. The first EM source 350 a can be coupled to a first matching network 352 a, and the first matching network 352 a can be coupled to a first coupling network 354 a. The second EM source 350 b can be coupled to a second matching network 352 b, and the second matching network 352 b can be coupled to a second coupling network 354 b. Alternatively, a plurality of matching networks (not shown) or a plurality of coupling networks (not shown) may be used.

The first coupling network 354 a can be removably coupled to the first cavity assembly 368 a that can be removably coupled to an upper portion of a first interface assembly 312 a of the process chamber 310. The first coupling network 354 a can be used to provide microwave energy to the first EM energy tuning space 369 a in the first cavity assembly 368 a. The second coupling network 354 b can be removably coupled to the second cavity assembly 368 b that can be removably coupled to an upper portion of a second interface assembly 312 b of the process chamber 310. The second coupling network 354 b can be used to provide additional microwave energy to the second EM energy tuning space 369 b in the second cavity assembly 368 b. Alternatively, other EM-coupling configurations may be used.

As shown in FIG. 3B, a controller 395 can be coupled 396 to the EM sources (350 a, 350 b), the matching networks (352 a, 352 b), the coupling networks (354 a, 354 b), and the cavity assemblies (368 a, 368 b), and the controller 395 can use process recipes to establish, control, and optimize the EM sources (350 a, 350 b), the matching networks (352 a, 352 b), the coupling networks (354 a, 354 b), and the cavity assemblies (368 a, 368 b) to control the plasma uniformity within the process space 315. For example, the EM sources (350 a, 350 b) can operate at a frequency from about 500 MHz. to about 5000 MHz. In addition, the controller 395 can be coupled 396 to the plasma sensors 306 and process sensors 307, and the controller 395 can use process recipes to establish, control, and optimize the data from the plasma sensors 306 and the process sensors 307 to control the plasma uniformity within the process space 315.

In addition, the controller 395 can be coupled 396 to gas supply system 340, to a gas supply subassembly 341, and to a gas showerhead 343. For example, the gas supply system 340, the gas supply subassembly 341 and the gas showerhead 343 can be configured to introduce one or more process gases to process space 315, and can include flow control and/or flow measuring devices.

During dry plasma etching, the process gas may comprise an etchant, a passivant, or an inert gas, or a combination of two or more thereof. For example, when plasma etching a dielectric film such as silicon oxide (SiO_(x)) or silicon nitride (Si_(x)N_(y)), the plasma etch gas composition generally includes a fluorocarbon-based chemistry (C_(x)F_(y)) such as at least one of C₄F₈, C₅F₈, C₃F₆, C₄F₆, CF₄, etc., and/or may include a fluorohydrocarbon-based chemistry (C_(x)H_(y)F_(z)) such as at least one of CHF₃, CH₂F₂, etc., and can have at least one of an inert gas, oxygen, CO or CO₂. Additionally, for example, when etching polycrystalline silicon (polysilicon), the plasma etch gas composition generally includes a halogen-containing gas such as HBr, Cl₂, NF₃, or SF₆ or a combination of two or more thereof, and may include fluorohydrocarbon-based chemistry (C_(x)H_(y)F_(z)) such as at least one of CHF₃, CH₂F₂, etc., and at least one of an inert gas, oxygen, CO or CO₂, or two or more thereof. During plasma enhanced deposition, the process gas may comprise a film forming precursor, a reduction gas, or an inert gas, or a combination of two or more thereof.

As shown in FIG. 3B, the third microwave processing system 300 can include a pressure control system 390 and port 391 coupled to the process chamber 310, and configured to evacuate the process chamber 310, as well as control the pressure within the process chamber 310. In addition, the third microwave processing system 300 can include a movable substrate holder 320 for processing substrate 305.

The front view of the third microwave processing system 300 includes a partial front view of a first cavity-control assembly 345 a that is shown coupled to a front view of a first cavity-tuning slab 346 a. The first cavity-control assembly 345 a and the first cavity-tuning slab 346 a can have a first x/z plane offset (z_(1aa)) associated therewith, and the first x/z plane offset (z_(1aa)) can vary from about 1 mm to about 10 mm.

The first cavity-control assembly 345 a can be used to move 347 a the first cavity-tuning slab 346 a cavity-tuning distances 348 a within the first EM-energy tuning space 369 a. The controller 395 can be coupled 396 to the cavity-control assembly 345 a, and the controller 395 can use process recipes to establish, control, and optimize the cavity-tuning distances 348 a to control and maintain the plasma uniformity within the process space 315 in real-time. For example, the cavity-tuning distances 348 a can vary from about 0.01 mm to about 10 mm, and the cavity-tuning distances 348 a can be wavelength-dependent and can vary from about (λ/4) to about (10λ).

In addition, the front view of the third microwave processing system 300 includes a partial front view of a second cavity-control assembly 345 b that is shown coupled to a front view of a second cavity-tuning slab 346 b. The second cavity-control assembly 345 b and the second cavity-tuning slab 346 b can have a second x/z plane offset (z_(1ba)) associated therewith, and the second x/z plane offset (z_(1ba)) vary from about 1 mm to about 10 mm.

The second cavity-control assembly 345 b can be used to move 347 b the second cavity-tuning slab 346 b second cavity-tuning distances 348 b within the second EM-energy tuning space 369 b. The controller 395 can be coupled 396 to the second cavity-control assembly 345 b, and the controller 395 can use process recipes to establish, control, and optimize the second cavity-tuning distances 348 b to control and maintain the plasma uniformity within the process space 315 in real-time. For example, the second cavity-tuning distances 348 b can vary from about 0.01 mm to about 10 mm, and the second cavity-tuning distances 348 b can be wavelength-dependent and can vary from about (λ/4) to about (10λ).

FIG. 3C shows a partial cut-away side view of the third process chamber 310 in the third microwave processing system 300. The side view shows a y/z plane view of a plurality of chamber walls 312 coupled to a first interface assembly 312 a and to a second interface assembly 312 b, thereby creating a partial cut-away side view of the process space 315 in the process chamber 310. The third microwave processing system 300 can be configured to form uniform plasma in the process space 315.

A partial side view of a first EM energy tuning space 369 a in the first cavity assembly 368 a and a partial side view of a second EM energy tuning space 369 b in the second cavity assembly 368 b are shown in FIG. 3C. A partial side view of the first set of plasma tuning rods (370 a-370 c), a partial side view of a first set of plasma-tuning slabs (361 a-361 c), a partial side view of a second set of plasma tuning rods (370 d-3700, and a partial side view of a second set of plasma-tuning slabs (361 d-3610 are shown in FIG. 3C.

Side views of a first set of isolation assemblies (364 a, 364 b, and 364 c) and a second set of isolation assemblies (364 d, 364 e, and 3640 are also shown in FIG. 3C. For example, first set of isolation assemblies (364 a, 364 b, and 364 c) can be used to removably couple the first set of plasma tuning rods {(370 a, 370 b, and 370 c) and (375 a, 375 b, and 375 c)} to a first interface assembly 312 a. Each of the first set of isolation assemblies (364 a, 364 b, and 364 c) can be removably coupled to a first interface assembly 312 a. In addition, the second set of isolation assemblies (364 d, 364 e, and 3640 can be used to removably couple the second set of plasma tuning rods {(370 d, 370 e, and 3700 and (375 d, 375 e, and 3750} to a second interface assembly 312 b. Each of the second set of isolation assemblies (364 d, 364 e, and 3640 can be removably coupled to a second interface assembly 312 b.

As shown in FIG. 3C, a first set of plasma-tuning slabs (361 a, 361 b, and 361 c) can be coupled to a first set of control assemblies (360 a, 360 b, and 360 c), and first set of control assemblies (360 a, 360 b, and 360 c) can be used to move (363 a, 363 b, and 363 c) the first set of plasma-tuning slabs (361 a, 361 b, and 361 c) the first set of EM-tuning distances (377 a, 377 b, and 377 c) relative to the EM-tuning portions (375 a, 375 b, and 375 c) within the first EM energy tuning space 369 a. In addition, a second set of plasma-tuning slabs (361 d, 361 e, and 3610 can be coupled to a second set of control assemblies (360 d, 360 e, and 3600, and the second set of control assemblies (360 d, 360 e, and 3600 can be used to move (363 d, 363 e, and 3630 the second set of plasma-tuning slabs (361 d, 361 e, and 3610 the second set of EM-tuning distances (377 d, 377 e, and 377 f) relative to the EM-tuning portions (375 d, 375 e, and 3750 within the second EM energy tuning space 369 b.

The first set of control assemblies (360 a, 360 b, and 360 c) can be coupled 396 to the controller 395, and the controller 395 can use process recipes to establish, control, and optimize the first set of EM-tuning distances (377 a, 377 b, and 377 c) to control the plasma uniformity within the process space 315. In addition, the second set of control assemblies (360 d, 360 e, and 360 f) can be coupled 396 to the controller 395, and the controller 395 can use process recipes to establish, control, and optimize the second set of EM-tuning distances (377 d, 377 e, and 377 f) to control the plasma uniformity within the process space 315.

The controller 395 can be coupled 396 to the EM sources (350 a, 350 b), the matching networks (352 a, 352 b), the coupling networks (354 a, 354 b), and the cavity assemblies (368 a, 368 b), and the controller 395 can use process recipes to establish, control, and optimize the EM sources (350 a, 350 b), the matching networks (352 a, 352 b), the coupling networks (354 a, 354 b), and the cavity assemblies (368 a, 368 b) to control the plasma uniformity within the process space 315. For example, the EM sources (350 a, 350 b) can operate at frequencies from about 500 MHz to about 5000 MHz. In addition, the controller 395 can be coupled 396 to the plasma sensors 306, the process sensors 307, and the cavity sensors (308 a and 308 b), and the controller 395 can use process recipes to establish, control, and optimize the data from the plasma sensors 306, the process sensors 307, and the cavity sensors (308 a and 308 b), to control the plasma uniformity in the process space 315.

The side view illustrates a process chamber 310 having a total width (y_(T)), and a total height (z_(T)) associated therewith in the y/z plane. The total width (y_(T)) can vary from about 50 mm to about 500 mm, and the total height (z_(T)) can vary from about 50 mm to about 500 mm.

FIG. 4A shows a partial cut-away top view of a fourth process chamber 410 in a fourth microwave processing system 400. The top view shows an x/y plane view of a first interface assembly 412 a, a second interface assembly 412 b, and a plurality of additional chamber walls 412 coupled to the first interface assembly 412 a and the second interface assembly 412 b thereby forming the fourth process chamber 410. For example, the chamber walls 412 can have wall thicknesses (t) associated therewith, and the wall thicknesses (t) can vary from about 1 mm to about 5 mm. The first interface assembly 412 a can have a first interface thickness (t_(i1)) associated therewith, and the first interface thickness (t_(i1)) can vary from about 1 mm to about 10 mm. The second interface assembly 412 b can have a second interface thickness (t_(i2)) associated therewith, and the second interface thickness (t_(i2)) can vary from about 1 mm to about 10 mm. The process space 415 can have a length (x_(T)) associated therewith, and the length (x_(T)) can vary from about 10 mm to about 500 mm.

The top view of the fourth microwave processing system 400 shows a cut-away view of a first cavity assembly 468 a having a first EM energy tuning space 469 a therein, and the first cavity assembly 468 a can include a first cavity wall 465 a, a second cavity wall 466 a, at least one third cavity wall 467 a, and one or more additional cavity walls (not shown). For example, and the first cavity assembly 468 a can be coupled to the first interface assembly 412 a using the first cavity wall 465 a, and walls (465 a, 466 a, and 467 a) can comprise dielectric material and can have wall thicknesses (t_(a)) associated therewith, and the wall thicknesses (t_(a)) can vary from about 1 mm to about 5 mm. In addition, the first EM energy tuning space 469 a can have a first length (x_(T1a)) and a first width (y_(1a)) associated therewith, the first length (x_(T1a)) can vary from about 10 mm to about 500 mm, and the first width (y_(1a)) can vary from about 5 mm to about 50 mm.

The top view of the fourth microwave processing system 400 also shows a cut-away view of a second cavity assembly 468 b having a second EM energy tuning space 469 b therein, and the second cavity assembly 468 b can include a first cavity wall 465 b, a second cavity wall 466 b, at least one third cavity wall 467 b, and one or more additional cavity walls (not shown). For example, and the second cavity assembly 468 b can be coupled to the second interface assembly 412 b using the first cavity wall 465 b, and walls (465 b, 466 b, and 467 b) can comprise dielectric material and can have wall thicknesses (t_(b)) associated therewith, and the wall thicknesses (t_(b)) can vary from about 1 mm to about 5 mm. In addition, the second EM energy tuning space 469 b can have a second length (x_(T1b)) and a second width (y_(1b)) associated therewith, the second length (x_(T1b)) can vary from about 10 mm to about 500 mm, and the second width (y_(1b)) can vary from about 5 mm to about 50 mm.

In some exemplary systems, a first set of isolation assemblies (464 a and 464 b) can be removably coupled to a first interface assembly 412 a and can be configured to isolate the process space 415 from the first EM energy tuning space 469 a. The first set of isolation assemblies (464 a and 464 b) can be used to removably couple the first set of plasma tuning rods {(470 a and 470 b) and (475 a and 475 b)} to a first interface assembly 412 a. For example, the first set of plasma-tuning portions (470 a and 470 b) can be configured in the process space 415, and the first set of EM-tuning portion (475 a and 475 b) can be configured within the first EM energy tuning space 469 a.

A second set of isolation assemblies (464 c and 464 d) can be removably coupled to the second interface assembly 412 b and can be configured to isolate the process space 415 from the second EM energy tuning space 469 b. The second set of isolation assemblies (464 c and 464 d) can be used to removably couple the second set of plasma tuning rods {(470 c and 470 d) and (475 c and 475 d)} to the second interface assembly 412 b. For example, the second set of plasma-tuning portions (470 c and 470 d) can be configured in the process space 415, and the second set of EM-tuning portion (475 c and 475 d) can be configured within the second EM energy tuning space 469 b.

Still referring to FIG. 4A, a first plasma-tuning rod (470 a, 475 a) can comprise dielectric material and can have a first plasma-tuning portion 470 a that can extend a first plasma-tuning distance 471 a into the process space 415 at a first location defined using (x_(2a)). The first plasma-tuning distance 471 a can vary from about 10 mm to about 400 mm.

A first EM-coupling region 462 a can be established at a first EM-coupling distance 476 a from the first cavity wall 465 a within the first EM energy tuning space 469 a established in the first cavity assembly 468 a, and the first EM-tuning portion 475 a can extend into the first EM-coupling region 462 a. The first EM-tuning portion 475 a can obtain first microwave energy from the first EM-coupling region 462 a, and the first microwave energy can be transferred to the process space 415 at the first location (x_(2a)) using the first plasma-tuning portion 470 a. The first EM-coupling region 462 a can include a maximum field region, a maximum voltage region, maximum energy region, or a maximum current region, or any combination thereof. For example, the first EM-coupling distance 476 a can vary from about 0.01 mm to about 10 mm, and the first EM-coupling distance 476 a can be wavelength-dependent and can vary from about (λ/4) to about (10λ).

A first plasma-tuning slab 461 a can comprise dielectric material, can be coupled to a first control assembly 460 a, and can be used to move 463 a the first plasma-tuning slab 461 a a first EM-tuning distance 477 a relative to the first EM-tuning portion 475 a of the first plasma-tuning rod (470 a, 475 a) within the first EM energy tuning space 469 a. The first control assembly 460 a and the first plasma-tuning slab 461 a can be used to optimize the microwave energy coupled from the first EM-coupling region 462 a to the first EM-tuning portion 475 a of the first plasma-tuning rod (370 a, 475 a). For example, the first EM-tuning distance 477 a can be established between the first EM-tuning portion 475 a and the first plasma-tuning slab 461 a within the first EM energy tuning space 469 a, and the first EM-tuning distance 477 a can vary from about 0.01 mm to about 1 mm.

The first plasma-tuning rod (470 a, 475 a) can have a first diameter (d_(1a)) associated therewith that can vary from about 0.01 mm to about 1 mm. The first plasma-tuning slab 461 a can have a first diameter (D_(1a)) associated therewith that can vary from about 1 mm to about 10 mm. The first EM-coupling region 462 a, the first control assembly 460 a, and the first plasma-tuning slab 461 a can have a first x/y plane offset (x_(1a)) associated therewith, and the first x/y plane offset (x_(1a)) can be wavelength-dependent and can vary from about a quarter wavelength (λ/4) to about (10λ). The first control assembly 460 a can have a cylindrical configuration and a diameter (d_(1a)) that can vary from about 1 mm to about 5 mm.

A second plasma-tuning rod (470 b, 475 b) can have a second plasma-tuning portion 470 b that can extend a second plasma-tuning distance 471 b into the process space 415 at a second location defined using (x_(1b)). For example, the second plasma-tuning distance 471 b can vary from about 10 mm to about 400 mm.

A second EM-coupling region 462 b can be established at a second EM-coupling distance 476 b from the first cavity wall 465 a within the first EM energy tuning space 469 a established in the first cavity assembly 468 a, and the second EM-tuning portion 475 b can extend into the second EM-coupling region 462 b. The second EM-tuning portion 475 b can obtain second microwave energy from the second EM-coupling region 462 b, and the second microwave energy can be transferred to the process space 415 at the second location (x_(1b)) using the second plasma-tuning portion 470 b. The second EM-coupling region 462 b can include a maximum field region, a maximum voltage region, maximum energy region, or a maximum current region, or any combination thereof. For example, the second EM-coupling distance 476 b can vary from about 0.01 mm to about 10 mm, and the second EM-coupling distance 476 b can be wavelength-dependent and can vary from about (λ/4) to about (10λ).

A second plasma-tuning slab 461 b can comprise dielectric material, can be coupled to a second control assembly 460 b, and can be used to move 463 b the second plasma-tuning slab 461 b a second EM-tuning distance 477 b relative to the second EM-tuning portion 475 b of the second plasma-tuning rod (470 b, 475 b) within the first EM energy tuning space 469 a. The second control assembly 460 b and the second plasma-tuning slab 461 b can be used to optimize the microwave energy coupled from the second EM-coupling region 462 b to the second EM-tuning portion 475 b of the second plasma-tuning rod (470 b, 475 b). For example, the second EM-tuning distance 477 b can be established between the second EM-tuning portion 475 b and the second plasma-tuning slab 461 b within the first EM energy tuning space 469 a, and the second EM-tuning distance 477 b can vary from about 0.01 mm to about 1 mm.

The second plasma-tuning rod (470 b, 475 b) can have a second diameter (d_(1b)) associated therewith that can vary from about 0.01 mm to about 1 mm. The second plasma-tuning slab 461 b can have a second diameter (D_(1b)) associated therewith that can vary from about 1 mm to about 10 mm. The second EM-coupling region 462 b, the second control assembly 460 b, and the second plasma-tuning slab 461 b can have a second x/y plane offset (x_(1b)) associated therewith, and the second x/y plane offset (x_(1b)) can be wavelength-dependent and can vary from about a quarter wavelength (λ/4) to about (10λ). The second control assembly 460 b can comprise dielectric material and can have a cylindrical configuration and a diameter (d_(1b)) that can vary from about 1 mm to about 5 mm.

A third plasma-tuning rod (470 c, 475 c) can comprise dielectric material and can have a third plasma-tuning portion 470 c that can extend a third plasma-tuning distance 471 c into the process space 415 at a third location defined using (x_(2c)). For example, the third plasma-tuning distance 471 c can vary from about 10 mm to about 400 mm.

A third EM-coupling region 462 c can be established at a third EM-coupling distance 476 c from the first cavity wall 465 a within the second EM energy tuning space 469 b established in the second cavity assembly 468 b, and the third EM-tuning portion 475 c can extend into the third EM-coupling region 462 c. The third EM-tuning portion 475 c can obtain third microwave energy from the third EM-coupling region 462 c, and the third microwave energy can be transferred to the process space 415 at the third location (x_(2c)) using the third plasma-tuning portion 470 c. The third EM-coupling region 462 c can include a maximum field region, a maximum voltage region, maximum energy region, or a maximum current region, or any combination thereof. For example, the third EM-coupling distance 476 c can vary from about 0.01 mm to about 10 mm, and the third EM-coupling distance 476 c can be wavelength-dependent and can vary from about (λ/4) to about (10λ).

A third plasma-tuning slab 461 c can comprise dielectric material, can be coupled to a third control assembly 460 c, and can be used to move 463 c the third plasma-tuning slab 461 c a third EM-tuning distance 477 c relative to the third EM-tuning portion 475 c of the third plasma-tuning rod (470 c, 475 c) within the second EM energy tuning space 469 b. The third control assembly 460 c and the third plasma-tuning slab 461 c can be used to optimize the microwave energy coupled from the third EM-coupling region 462 c to the third EM-tuning portion 475 c of the third plasma-tuning rod (470 c, 475 c). For example, the third EM-tuning distance 477 c can be established between the third EM-tuning portion 475 c and the third plasma-tuning slab 461 c within the second EM energy tuning space 469 b, and the third EM-tuning distance 477 c can vary from about 0.01 mm to about 1 mm.

The third plasma-tuning rod (470 c, 475 c) can have a third diameter (d_(1c)) associated therewith that can vary from about 0.01 mm to about 1 mm. The third plasma-tuning slab 461 c can have a third diameter (DO associated therewith that can vary from about 1 mm to about 10 mm. The third EM-coupling region 462 c, the third control assembly 460 c, and the third plasma-tuning slab 461 c can have a third x/y plane offset (x_(1c)) associated therewith, and the third x/y plane offset (x_(1c)) can be wavelength-dependent and can vary from about a quarter wavelength (λ/4) to about (10λ). The third control assembly 460 c can comprise dielectric material, can have a cylindrical configuration and a diameter (d₁) that can vary from about 1 mm to about 5 mm.

A fourth plasma-tuning rod (470 d, 475 d) can comprise dielectric material and can have a fourth plasma-tuning portion 470 d that can extend a fourth plasma-tuning distance 471 d into the process space 415 at a fourth location defined using (x_(2d)). For example, the fourth plasma-tuning distance 471 d can vary from about 10 mm to about 400 mm.

A fourth EM-coupling region 462 d can be established at a fourth EM-coupling distance 476 d from the first cavity wall 465 a within the second EM energy tuning space 469 b established in the second cavity assembly 468 b, and the fourth EM-tuning portion 475 d can extend into the fourth EM-coupling region 462 d. The fourth EM-tuning portion 475 d can obtain fourth microwave energy from the fourth EM-coupling region 462 d, and the fourth microwave energy can be transferred to the process space 415 at the fourth location (x_(2d)) using the fourth plasma-tuning portion 470 d. The fourth EM-coupling region 462 d can include a maximum field region, a maximum voltage region, maximum energy region, or a maximum current region, or any combination thereof. For example, the fourth EM-coupling distance 476 d can vary from about 0.01 mm to about 10 mm, and the fourth EM-coupling distance 476 d can be wavelength-dependent and can vary from about (λ/4) to about (10λ).

A fourth plasma-tuning slab 461 d can comprise dielectric material, can be coupled to a fourth control assembly 460 d, and can be used to move 463 d the fourth plasma-tuning slab 461 d a fourth EM-tuning distance 477 d relative to the fourth EM-tuning portion 475 d of the fourth plasma-tuning rod (470 d, 475 d) within the second EM energy tuning space 469 b. The fourth control assembly 460 d and the fourth plasma-tuning slab 461 d can be used to optimize the microwave energy coupled from the fourth EM-coupling region 462 d to the fourth EM-tuning portion 475 d of the fourth plasma-tuning rod (470 d, 475 d). For example, the fourth EM-tuning distance 477 d can be established between the fourth EM-tuning portion 475 d and the fourth plasma-tuning slab 461 d within the second EM energy tuning space 469 b, and the fourth EM-tuning distance 477 d can vary from about 0.01 mm to about 1 mm.

The fourth plasma-tuning rod (470 d, 475 d) can have a fourth diameter (d_(1d)) associated therewith that can vary from about 0.01 mm to about 1 mm. The fourth plasma-tuning slab 461 d can have a fourth diameter (D_(1d)) associated therewith that can vary from about 1 mm to about 10 mm. The fourth EM-coupling region 462 d, the fourth control assembly 460 d, and the fourth plasma-tuning slab 461 d can have a fourth x/y plane offset (x_(1d)) associated therewith, and the fourth x/y plane offset (x_(1d)) can be wavelength-dependent and can vary from about a quarter wavelength (λ/4) to about (10λ). The fourth control assembly 460 d can comprise dielectric material, can have a cylindrical configuration and a diameter (d_(1d)) that can vary from about 1 mm to about 5 mm.

The top view of the fourth microwave processing system 400 includes a top view of a first cavity-control assembly 445 a that is shown coupled to a top view of a first cavity-tuning slab 446 a. The first cavity-control assembly 445 a can have a first diameter (d_(1aa)) associated therewith, and the first diameter (d_(1aa)) can vary from about 0.01 mm to about 1 mm. The first cavity-tuning slab 446 a can have a second diameter (D_(1aa)) associated therewith, and the second diameter (D_(1aa)) can vary from about 1 mm to about 10 mm. The first cavity-control assembly 445 a and the first cavity-tuning slab 446 a can have a first x/y plane offset (y_(1aa)) associated therewith, and the first x/y plane offset (y_(1aa)) can vary from about 1 mm to about 10 mm.

In addition, the top view of the fourth microwave processing system 400 includes a top view of a second cavity-control assembly 445 b that is shown coupled to a top view of a second cavity-tuning slab 446 b. The second cavity-control assembly 445 b can have a first additional diameter (d_(1ba)) associated therewith, and the first additional diameter (d_(1ba)) can vary from about 0.01 mm to about 1 mm. The second cavity-tuning slab 446 b can have a second additional diameter (D_(1ba)) associated therewith, and the second additional diameter (D_(1ba)) can vary from about 1 mm to about 10 mm. The second cavity-control assembly 445 b and the second cavity-tuning slab 446 b can have a second x/y plane offset (y_(1ba)) associated therewith, and the second x/y plane offset (y_(1ba)) vary from about 1 mm to about 10 mm.

FIG. 4B shows a partial cut-away front view of a fourth process chamber 410 in a fourth microwave processing system 400. The front view shows an x/z plane view of a plurality of additional walls 412 coupled to each other, thereby creating a partial cut-away front view of a process space 415 in the fourth process chamber 410. The fourth microwave processing system 400 can be configured to form plasma in the process space 415.

The front view of the fourth microwave processing system 400 shows a cut-away view of a first cavity assembly 468 a having a first EM energy tuning space 469 a therein, and the first cavity assembly 468 a can include a first cavity wall 465 a, a second cavity wall 466 a, at least one third cavity wall 467 a, and one or more additional cavity walls (not shown). For example, and the first cavity assembly 468 a can be coupled to the first interface assembly 412 a using the first cavity wall 465 a. The front view also shows a cut-away view of a second cavity assembly 468 b having a second EM energy tuning space 469 b therein, and the second cavity assembly 468 b can include a first cavity wall 465 b, a second cavity wall 466 b, at least one third cavity wall 467 b, and one or more additional cavity walls (not shown). For example, and the second cavity assembly 468 b can be coupled to the second interface assembly 412 b using the first cavity wall 465 b.

A partial front view (dash line view) of a first set of plasma tuning rods (470 a and 470 b), a partial front view (dash line view) of a first set of plasma-tuning slabs (461 a and 461 b), a partial front view (dotted line view) of a second set of plasma tuning rods (470 c and 470 d), and a partial front view (dotted line view) of a second set of plasma-tuning slabs (461 c and 461 d) are shown in FIG. 4B.

The first set of plasma tuning rods (470 a and 470 b) and the first set of plasma-tuning slabs (461 a and 461 b) can have a first set of x/y plane offsets (x_(2a-b)) associated therewith that can vary from about 10 mm to about 100 mm. The first set of plasma tuning rods (470 a and 470 b) and the first set of plasma-tuning slabs (461 a and 461 b) can have a first set of x/z plane offsets (z_(1a-b)) associated therewith, and the first set of x/z plane offsets (z_(1a-b)) can vary from about 100 mm to about 400 mm.

The second set of plasma tuning rods (470 c and 470 d) and the second set of plasma-tuning slabs (461 c and 461 d) can have a second set of x/y plane offsets (x_(2c-d)) associated therewith, and the second set of x/y plane offsets (x_(2c-d)) can vary from about 10 mm to about 100 mm. The second set of plasma tuning rods (470 c and 470 d) and the second set of plasma-tuning slabs (461 c and 461 d) can have a second set of x/z plane offsets (z_(1c-d)) associated therewith, and the second set of x/z plane offsets (z_(1c-d)) can vary from about 100 mm to about 400 mm.

FIG. 4B shows that the fourth microwave processing system 400 can include one or more plasma sensors 406 coupled to a chamber wall 412 to obtain first plasma data. In addition, the fourth microwave processing system 400 may be configured to process 400 mm substrates, 300 mm substrates, or larger-sized substrates. In addition, square and/or rectangular chambers can be configured so that the fourth microwave processing system 400 may be configured to process square or rectangular substrates, wafers, or LCDs regardless of their size, as would be appreciated by those skilled in the art. Therefore, while aspects of the invention will be described in connection with the processing of a semiconductor substrate, the invention is not limited solely thereto.

As shown in FIG. 4B, a first EM source 450 a can be coupled to a first cavity assembly 468 a, and a second EM source 450 b can be coupled to a second cavity assembly 468 b. The first EM source 450 a can be coupled to a first matching network 452 a, and the first matching network 452 a can be coupled to a first coupling network 454 a. The second EM source 450 b can be coupled to a second matching network 452 b, and the second matching network 452 b can be coupled to a second coupling network 454 b. Alternatively, a plurality of matching networks (not shown) or a plurality of coupling networks (not shown) may be used.

The first coupling network 454 a can be removably coupled to the first cavity assembly 468 a that can be removably coupled to an upper portion of a first interface assembly 412 a of the process chamber 410. The first coupling network 454 a can be used to provide microwave energy to the first EM energy tuning space 469 a in the first cavity assembly 468 a. The second coupling network 454 b can be removably coupled to the second cavity assembly 468 b that can be removably coupled to an upper portion of a second interface assembly 412 b of the process chamber 410. The second coupling network 454 b can be used to provide additional microwave energy to the second EM energy tuning space 469 b in the second cavity assembly 468 b. Alternatively, other EM-coupling configurations may be used.

As shown in FIG. 4B, a controller 495 can be coupled 496 to the EM sources (450 a, 450 b), the matching networks (452 a, 452 b), the coupling networks (454 a, 454 b), and the cavity assemblies (468 a, 468 b), and the controller 495 can use process recipes to establish, control, and optimize the EM sources (450 a, 450 b), the matching networks (452 a, 452 b), the coupling networks (454 a, 454 b), and the cavity assemblies (468 a, 468 b) to control the plasma uniformity within the process space 415. For example, the EM sources (450 a, 450 b) can operate at a frequency from about 500 MHz. to about 5000 MHz. In addition, the controller 495 can be coupled 496 to the plasma sensors 406 and process sensors 407, and the controller 495 can use process recipes to establish, control, and optimize the data from the plasma sensors 406 and the process sensors 407 to control the plasma uniformity within the process space 415.

In addition, the controller 495 can be coupled 496 to gas supply system 440, to a gas supply subassembly 441, and to a gas showerhead 443. For example, the gas supply system 440, the gas supply subassembly 441 and the gas showerhead 443 can be configured to introduce one or more process gases to process space 415, and can include flow control and/or flow measuring devices.

During dry plasma etching, the process gas may comprise an etchant, a passivant, or an inert gas, or a combination of two or more thereof. For example, when plasma etching a dielectric film such as silicon oxide (SiO_(x)) or silicon nitride (Si_(x)N_(y)), the plasma etch gas composition generally includes a fluorocarbon-based chemistry (C_(x)F_(y)) such as at least one of C₄F₈, C₅F₈, C₃F₆, C₄F₆, CF₄, etc., and/or may include a fluorohydrocarbon-based chemistry (C_(x)H_(y)F_(z)) such as at least one of CHF₃, CH₂F₂, etc., and can have at least one of an inert gas, oxygen, CO or CO₂. Additionally, for example, when etching polycrystalline silicon (polysilicon), the plasma etch gas composition generally includes a halogen-containing gas such as HBr, Cl₂, NF₃, or SF₆ or a combination of two or more thereof, and may include fluorohydrocarbon-based chemistry (C_(x)H_(y)F_(z)) such as at least one of CHF₃, CH₂F₂, etc., and at least one of an inert gas, oxygen, CO or CO₂, or two or more thereof. During plasma enhanced deposition, the process gas may comprise a film forming precursor, a reduction gas, or an inert gas, or a combination of two or more thereof.

As shown in FIG. 4B, the fourth microwave processing system 400 can include a pressure control system 490 and port 491 coupled to the process chamber 410, and configured to evacuate the process chamber 410, as well as control the pressure within the process chamber 410. In addition, the fourth microwave processing system 400 can include a movable substrate holder 420 for processing substrate 405.

The front view of the fourth microwave processing system 400 includes a partial front view of a first cavity-control assembly 445 a that is shown coupled to a front view of a first cavity-tuning slab 446 a. The first cavity-control assembly 445 a and the first cavity-tuning slab 446 a can have a first x/z plane offset (z_(1aa)) associated therewith, and the first x/z plane offset (z_(1aa)) can vary from about 1 mm to about 10 mm.

The first cavity-control assembly 445 a can be used to move 447 a the first cavity-tuning slab 446 a fourth cavity-tuning distances 448 a within the first EM-energy tuning space 469 a. The controller 495 can be coupled 496 to the first cavity-control assembly 445 a, and the controller 495 can use process recipes to establish, control, and optimize the fourth cavity-tuning distances 448 a to control and maintain the plasma uniformity within the process space 415 in real-time. For example, the fourth cavity-tuning distances 448 a can vary from about 0.01 mm to about 10 mm, and the fourth cavity-tuning distances 448 a can be wavelength-dependent and can vary from about (λ/4) to about (10λ).

In addition, the front view of the fourth microwave processing system 400 includes a partial front view of a second cavity-control assembly 445 b that is shown coupled to a front view of a second cavity-tuning slab 446 b. The second cavity-control assembly 445 b and the second cavity-tuning slab 446 b can have a second x/z plane offset (z_(1ba)) associated therewith that can vary from about 1 mm to about 10 mm.

The second cavity-control assembly 445 b can be used to move 447 b the second cavity-tuning slab 446 b second cavity-tuning distances 448 b within the second EM-energy tuning space 469 b. The controller 495 can be coupled to the second cavity-control assembly 445 b, and the controller 495 can use process recipes to establish, control, and optimize the second cavity-tuning distances 448 b to control and maintain the plasma uniformity within the process space 415 in real-time. For example, the second cavity-tuning distances 448 b can vary from about 0.01 mm to about 10 mm, and the second cavity-tuning distances 448 b can be wavelength-dependent and can vary from about (λ/4) to about (10λ).

FIG. 4C shows a partial cut-away side view of the fourth process chamber 410 in the fourth microwave processing system 400. The side view shows a y/z plane view of a plurality of chamber walls 412 coupled to a first interface assembly 412 a and to a second interface assembly 412 b, thereby creating a partial cut-away side view of the process space 415 in the process chamber 410. The fourth microwave processing system 400 can be configured to form plasma in the process space 415.

A partial side view of a first EM energy tuning space 469 a in the first cavity assembly 468 a and a partial side view of a second EM energy tuning space 469 b in the second cavity assembly 468 b are shown in FIG. 4C. A partial side view of the first set of plasma tuning rods (470 a and 470 b), a partial side view of a first set of plasma-tuning slabs (461 a and 461 b), a partial side view of a second set of plasma tuning rods (470 c and 470 d), and a partial side view of a second set of plasma-tuning slabs (461 c and 461 d) are shown in FIG. 4C.

Side views of a first set of isolation assemblies (464 a and 464 b) and a second set of isolation assemblies (464 c and 464 d) are also shown in FIG. 4C. For example, first set of isolation assemblies (464 a and 464 b) can be used to removably couple the first set of plasma tuning rods {(470 a and 470 b) and (475 a and 475 b)} to a first interface assembly 412 a. Each of the first set of isolation assemblies (464 a and 464 b) can be removably coupled to a first interface assembly 412 a. In addition, the second set of isolation assemblies (464 c and 464 d) can be used to removably couple the second set of plasma tuning rods {(470 c and 470 d) and (475 c and 475 d)} to a second interface assembly 412 b. Each of the second set of isolation assemblies (464 c and 464 d) can be removably coupled to a second interface assembly 412 b.

As shown in FIG. 4C, a first set of plasma-tuning slabs (461 a and 461 b) can be coupled to a first set of control assemblies (460 a and 460 b), and first set of control assemblies (460 a and 460 b) can be used to move (463 a and 463 b) the first set of plasma-tuning slabs (461 a and 461 b) the first set of EM-tuning distances (477 a and 477 b) relative to the EM-tuning portions (475 a and 475 b) within the first EM energy tuning space 469 a. In addition, a second set of plasma-tuning slabs (461 c and 461 d) can be coupled to a second set of control assemblies (460 c and 460 d), and the second set of control assemblies (460 c and 460 d) can be used to move (463 c and 463 d) the second set of plasma-tuning slabs (461 c and 461 d) the second set of EM-tuning distances (477 c and 477 d) relative to the EM-tuning portions (475 c and 475 d) within the second EM energy tuning space 469 b.

The first set of control assemblies (460 a and 460 b) can be coupled to the controller 495, and the controller 495 can use process recipes to establish, control, and optimize the first set of EM-tuning distances (477 a and 477 b) to control the plasma uniformity within the process space 415. In addition, the second set of control assemblies (460 c and 460 d) can be coupled to the controller 495, and the controller 495 can use process recipes to establish, control, and optimize the second set of EM-tuning distances (477 c and 477 d) to control the plasma uniformity within the process space 415.

The controller 495 can be coupled 496 to the EM sources (450 a, 450 b), the matching networks (452 a, 452 b), the coupling networks (454 a, 454 b), and the cavity assemblies (468 a, 468 b), and the controller 495 can use process recipes to establish, control, and optimize the EM sources (450 a, 450 b), the matching networks (452 a, 452 b), the coupling networks (454 a, 454 b), and the cavity assemblies (468 a, 468 b) to control the plasma uniformity within the process space 415. For example, the EM sources (450 a, 450 b) can operate at frequencies from about 500 MHz to about 5000 MHz. In addition, the controller 495 can be coupled 496 to the plasma sensors 406, the process sensors 407, and the cavity sensors (408 a and 408 b), and the controller 495 can use process recipes to establish, control, and optimize the data from the plasma sensors 406, the process sensors 407, and the cavity sensors (408 a and 408 b), to control the plasma uniformity within the process space 415.

The side view illustrates a process chamber 410 having a total width (y_(T)), and a total height (z_(T)) associated therewith in the y/z plane. For example, the total width (y_(T)) can vary from about 50 mm to about 500 mm, and the total height (z_(T)) can vary from about 50 mm to about 500 mm.

FIGS. 5A-5D show different views of exemplary plasma-tuning rods in accordance with embodiments of the invention. FIG. 5A shows a front view and a side view of a first exemplary plasma-tuning rod (570 a, 575 a). The first plasma-tuning portion 570 a can have first lengths (y₁₁) associated therewith, and the first lengths (y₁₁) can vary from about 1 mm to about 400 mm. The first EM-tuning portion 575 a can have lengths (y₁₂) associated therewith, and the lengths (y₁₂) can vary from about 1 mm to about 400 mm. The first plasma-tuning portion 570 a and the first EM-tuning portion 575 a can have first heights (x₁) associated therewith, and the first heights (x₁) can vary from about 0.1 mm to about 10 mm. The first plasma-tuning portion 570 a and the first EM-tuning portion 575 a can have first widths (z₁) associated therewith, and the first widths (z₁) can vary from about 0.1 mm to about 10 mm.

FIG. 5B shows a front view and a side view of a second exemplary plasma-tuning rod (570 b, 575 b). The second plasma-tuning portion 570 b can have first lengths (y₂₁) associated therewith, and the first lengths (y₂₁) can vary from about 1 mm to about 400 mm. The second EM-tuning portion 575 b can have lengths (y₂₂) associated therewith, and the lengths (y₂₂) can vary from about 1 mm to about 400 mm. The second plasma-tuning portion 570 b and the second EM-tuning portion 575 b can have second heights (x₂) associated therewith, and the second heights (x₂) can vary from about 0.1 mm to about 10 mm. The second plasma-tuning portion 570 b and the second EM-tuning portion 575 b can have second widths (z₂) associated therewith, and the second widths (z₂) can vary from about 0.1 mm to about 10 mm.

FIG. 5C shows a front view and a side view of a third exemplary plasma-tuning rod (570 c, 575 c). The third plasma-tuning portion 570 c can have third lengths (y₃₁) associated therewith, and the third lengths (y₃₁) can vary from about 1 mm to about 400 mm. The third EM-tuning portion 575 c can have a length (y₃₂) associated therewith, and the length (y₃₂) can vary from about 1 mm to about 400 mm. The third plasma-tuning portion 570 c and the third EM-tuning portion 575 c can have third heights (x₃) associated therewith, and the third heights (x₃) can vary from about 0.1 mm to about 10 mm. The third plasma-tuning portion 570 c and the third EM-tuning portion 575 c can have third widths (z₃) associated therewith, and the third widths (z₃) can vary from about 0.1 mm to about 10 mm.

FIG. 5D shows a front view and a side view of a fourth exemplary plasma-tuning rod (570 d, 575 d). The fourth plasma-tuning portion 570 d can have fourth lengths (y₄₁) associated therewith, and the fourth lengths (y₄₁) can vary from about 1 mm to about 400 mm. The fourth EM-tuning portion 575 d can have a length (y₄₂) associated therewith, and the length (y₄₂) can vary from about 1 mm to about 400 mm. The fourth plasma-tuning portion 570 d and the fourth EM-tuning portion 575 d can have fourth heights (x₄) associated therewith, and the fourth heights (x₄) can vary from about 0.1 mm to about 10 mm. The fourth plasma-tuning portion 570 d and the fourth EM-tuning portion 575 d can have fourth widths (z₄) associated therewith, and the fourth widths (z₄) can vary from about 0.1 mm to about 10 mm.

FIGS. 6A-6D show different views of exemplary plasma-tuning rods in accordance with embodiments of the invention. FIG. 6A shows a front view and a side view of a first exemplary plasma-tuning rod (670 a, 675 a). The first plasma-tuning portion 670 a can have first lengths (y₁₁) associated therewith, and the first lengths (y₁₁) can vary from about 1 mm to about 400 mm. The first EM-tuning portion 675 a can have lengths (y₁₂) associated therewith, and the lengths (y₁₂) can vary from about 1 mm to about 400 mm. The first plasma-tuning portion 670 a and the first EM-tuning portion 675 a can have first heights (x₁) associated therewith, and the first heights (x₁) can vary from about 0.1 mm to about 10 mm. The first plasma-tuning portion 670 a and the first EM-tuning portion 675 a can have first widths (z₁) associated therewith, and the first widths (z₁) can vary from about 0.1 mm to about 10 mm. The first plasma-tuning portion 670 a and the first EM-tuning portion 675 a can have first thicknesses (t_(z1)) associated therewith, and the first thicknesses (t_(z1)) can vary from about 0.01 mm to about 1 mm.

FIG. 6B shows a front view and a side view of a second exemplary plasma-tuning rod (670 b, 675 b). The second plasma-tuning portion 670 b can have first lengths (y₂₁) associated therewith, and the first lengths (y₂₁) can vary from about 1 mm to about 400 mm. The second EM-tuning portion 675 b can have lengths (y₂₂) associated therewith, and the lengths (y₂₂) can vary from about 1 mm to about 400 mm. The second plasma-tuning portion 670 b and the second EM-tuning portion 675 b can have second heights (x₂) associated therewith, and the second heights (x₂) can vary from about 0.1 mm to about 10 mm. The second plasma-tuning portion 670 b and the second EM-tuning portion 675 b can have second widths (z₂) associated therewith, and the second widths (z₂) can vary from about 0.1 mm to about 10 mm. The second plasma-tuning portion 670 b and the second EM-tuning portion 675 b can have second thicknesses (t_(z2)) associated therewith, and the second thicknesses (t_(z2)) can vary from about 0.01 mm to about 1 mm.

FIG. 6C shows a front view and a side view of a third exemplary plasma-tuning rod (670 c, 675 c). The third plasma-tuning portion 670 c can have third lengths (y₃₁) associated therewith, and the third lengths (y₃₁) can vary from about 1 mm to about 400 mm. The third EM-tuning portion 675 c can have a length (y₃₂) associated therewith, and the length (y₃₂) can vary from about 1 mm to about 400 mm. The third plasma-tuning portion 670 c and the third EM-tuning portion 675 c can have third heights (x₃) associated therewith, and the third heights (x₃) can vary from about 0.1 mm to about 10 mm. The third plasma-tuning portion 670 c and the third EM-tuning portion 675 c can have third widths (z₃) associated therewith, and the third widths (z₃) can vary from about 0.1 mm to about 10 mm. The third plasma-tuning portion 670 c and the third EM-tuning portion 675 c can have third thicknesses (t_(z3) and t_(x3)) associated therewith, and the third thicknesses (t_(z3) and t_(x3)) can vary from about 0.01 mm to about 1 mm.

FIG. 6D shows a front view and a side view of a fourth exemplary plasma-tuning rod (670 d, 675 d). The fourth plasma-tuning portion 670 d can have fourth lengths (y₄₁) associated therewith, and the fourth lengths (y₄₁) can vary from about 1 mm to about 400 mm. The fourth EM-tuning portion 675 d can have a length (y₄₂) associated therewith, and the length (y₄₂) can vary from about 1 mm to about 400 mm. The fourth plasma-tuning portion 670 d and the fourth EM-tuning portion 675 d can have fourth heights (x₄) associated therewith, and the fourth heights (x₄) can vary from about 0.1 mm to about 10 mm. The fourth plasma-tuning portion 670 d and the fourth EM-tuning portion 675 d can have fourth widths (z₄) associated therewith, and the fourth widths (z₄) can vary from about 0.1 mm to about 10 mm. The fourth plasma-tuning portion 670 d and the fourth EM-tuning portion 675 d can have fourth thicknesses (t_(z4) and t_(x4)) associated therewith, and the fourth thicknesses (t_(z4) and t_(x4)) can vary from about 0.01 mm to about 1 mm.

FIGS. 7A-7D show different views of exemplary plasma-tuning rods in accordance with embodiments of the invention. FIG. 7A shows a front view and a side view of a first exemplary plasma-tuning rod (770 a, 775 a). The first plasma-tuning portion 770 a can have first lengths (y₁₁) associated therewith, and the first lengths (y₁₁) can vary from about 1 mm to about 400 mm. The first EM-tuning portion 775 a can have lengths (y₁₂) associated therewith, and the lengths (y₁₂) can vary from about 1 mm to about 400 mm. The first plasma-tuning portion 770 a and the first EM-tuning portion 775 a can have first heights (x₁) associated therewith, and the first heights (x₁) can vary from about 0.1 mm to about 10 mm. The first plasma-tuning portion 770 a and the first EM-tuning portion 775 a can have first widths (z₁) associated therewith, and the first widths (z₁) can vary from about 0.1 mm to about 10 mm. A first temperature control loop 772 a can be configured within the first exemplary plasma-tuning rod (770 a, 775 a). For example, a temperature control fluid and/or gas can flow through the first temperature control loop 772 a to control the temperature of the first exemplary plasma-tuning rod (770 a, 775 a). The first temperature control loop 772 a can have first diameters (d_(a1)) associated therewith, and the first diameters (d_(a1)) can vary from about 0.001 mm to about 0.1 mm. In addition, the first temperature control loop 772 a have first offsets (l_(x11) and l_(x12)) associated therewith, and the first offsets (l_(x11) and l_(x12)) can vary from about 0.01 mm to about 0.1 mm.

FIG. 7B shows a front view and a side view of a second exemplary plasma-tuning rod (770 b, 775 b). The second plasma-tuning portion 770 b can have first lengths (y₂₁) associated therewith, and the first lengths (y₂₁) can vary from about 1 mm to about 400 mm. The second EM-tuning portion 775 b can have lengths (y₂₂) associated therewith, and the lengths (y₂₂) can vary from about 1 mm to about 400 mm. The second plasma-tuning portion 770 b and the second EM-tuning portion 775 b can have second heights (x₂) associated therewith, and the second heights (x₂) can vary from about 0.1 mm to about 10 mm. The second plasma-tuning portion 770 b and the second EM-tuning portion 775 b can have second widths (z₂) associated therewith, and the second widths (z₂) can vary from about 0.1 mm to about 10 mm. A second temperature control loop 772 b can be configured within the second exemplary plasma-tuning rod (770 b, 775 b). For example, a temperature control fluid and/or gas can flow through the second temperature control loop 772 b to control the temperature of the second exemplary plasma-tuning rod (770 b, 775 b). The second temperature control loop 772 b can have second diameters (d_(z2)) associated therewith, and the second diameters (d_(z2)) can vary from about 0.001 mm to about 0.1 mm. In addition, the second temperature control loop 772 b have second offsets (l_(x21) and l_(x22)) associated therewith, and the second offsets (l_(x21) and l_(x22)) can vary from about 0.01 mm to about 0.1 mm.

FIG. 7C shows a front view and a side view of a third exemplary plasma-tuning rod (770 c, 775 c). The third plasma-tuning portion 770 c can have third lengths (y₃₁) associated therewith, and the third lengths (y₃₁) can vary from about 1 mm to about 400 mm. The third EM-tuning portion 775 c can have a length (y₃₂) associated therewith, and the length (y₃₂) can vary from about 1 mm to about 400 mm. The third plasma-tuning portion 770 c and the third EM-tuning portion 775 c can have third heights (x₃) associated therewith, and the third heights (x₃) can vary from about 0.1 mm to about 10 mm. The third plasma-tuning portion 770 c and the third EM-tuning portion 775 c can have third widths (z₃) associated therewith, and the third widths (z₃) can vary from about 0.1 mm to about 10 mm. A third temperature control loop 772 c can be configured within the third exemplary plasma-tuning rod (770 c, 775 c). For example, a temperature control fluid and/or gas can flow through the third temperature control loop 772 c to control the temperature of the third exemplary plasma-tuning rod (770 c, 775 c). The third temperature control loop 772 c can have third diameters (d_(z3)) associated therewith, and the third diameters (d_(z3)) can vary from about 0.001 mm to about 0.1 mm. In addition, the third temperature control loop 772 c have third offsets (l_(x31) and l_(x32)) associated therewith, and the third offsets (l_(x31) and l_(x32)) can vary from about 0.01 mm to about 0.1 mm.

FIG. 7D shows a front view and a side view of a fourth exemplary plasma-tuning rod (770 d, 775 d). The fourth plasma-tuning portion 770 d can have fourth lengths (y₄₁) associated therewith, and the fourth lengths (y₄₁) can vary from about 1 mm to about 400 mm. The fourth EM-tuning portion 775 d can have a length (y₄₂) associated therewith, and the length (y₄₂) can vary from about 1 mm to about 400 mm. The fourth plasma-tuning portion 770 d and the fourth EM-tuning portion 775 d can have fourth heights (x₄) associated therewith, and the fourth heights (x₄) can vary from about 0.1 mm to about 10 mm. The fourth plasma-tuning portion 770 d and the fourth EM-tuning portion 775 d can have fourth widths (z₄) associated therewith, and the fourth widths (z₄) can vary from about 0.1 mm to about 10 mm. A fourth temperature control loop 772 d can be configured within the fourth exemplary plasma-tuning rod (770 d, 775 d). For example, a temperature control fluid and/or gas can flow through the fourth temperature control loop 772 d to control the temperature of the fourth exemplary plasma-tuning rod (770 d, 775 d). The fourth temperature control loop 772 d can have fourth diameters (d_(z4)) associated therewith, and the fourth diameters (d_(z4)) can vary from about 0.001 mm to about 0.1 mm. In addition, the fourth temperature control loop 772 d have fourth offsets (l_(x41) and l_(x42)) associated therewith, and the fourth offsets (l_(x41) and l_(x42)) can vary from about 0.01 mm to about 0.1 mm.

FIG. 8 illustrates a flow diagram for an exemplary operating procedure in accordance with embodiments of the invention. An exemplary multi-step procedure 800 is shown in FIG. 8.

In 810, a substrate can be positioned on a substrate holder in a process chamber, and a first cavity assembly (168 a, FIG. 1) and a second cavity assembly (168 b, FIG. 1) can be coupled to the process chamber. In one embodiment, the first cavity assembly (168 a, FIG. 1) with the first EM energy tuning space (169 a, FIG. 1) therein can be coupled the first process chamber (110, FIG. 1) using the first interface assembly (112 a, FIG. 1), and the second cavity assembly (168 b, FIG. 1) with the second EM energy tuning space (169 b, FIG. 1) therein can be coupled the first process chamber (110, FIG. 1) using the second interface assembly (112 b, FIG. 1).

In 820, a first set of first plasma-tuning rods {(170 a-170 e) and (175 a-175 e), FIG. 1} can be configured from the first cavity assembly (168 a, FIG. 1) through a first interface assembly (112 a, FIG. 1) into the process space (115, FIG. 1) in the first process chamber (110, FIG. 1). A first set of isolation assemblies (164 a-164 e, FIG. 1) can be removably coupled to the first interface assembly (112 a, FIG. 1) and can be configured to isolate the process space (115, FIG. 1) in the first process chamber (110, FIG. 1) from the first EM energy tuning space (169 a, FIG. 1) in the first cavity assembly (168 a, FIG. 1). The first set of isolation assemblies (164 a-164 e, FIG. 1) can be used to removably couple the first set of plasma tuning rods {(170 a-170 e) and (175 a-175 e), FIG. 1} to the first interface assembly (112 a, FIG. 1). For example, the first plasma-tuning portions (170 a-170 e, FIG. 1) can be configured in the process space (115, FIG. 1), and the first EM-tuning portions (175 a-175 e, FIG. 1) can be configured within the first EM energy tuning space (169 a, FIG. 1).

In 830, a set of second plasma-tuning rods {(170 f-170 j) and (175 f-175 j), FIG. 1} can be configured from the second cavity assembly (168 b, FIG. 1) through a second interface assembly (112 b, FIG. 1) into the process space (115, FIG. 1) in the first process chamber (110, FIG. 1). A second set of isolation assemblies (164 f-164 j, FIG. 1) can be removably coupled to the second interface assembly (112 b, FIG. 1) and can be configured to isolate the process space (115, FIG. 1) in the first process chamber (110, FIG. 1) from the second EM energy tuning space (169 b, FIG. 1) in the second cavity assembly (168 b, FIG. 1). The second set of isolation assemblies (164 f-164 j, FIG. 1) can be used to removably couple the set of second plasma tuning rods {(170 f-170 j) and (175 f-175 j), FIG. 1} to the second interface assembly (112 b, FIG. 1). For example, the second set of plasma-tuning portions (170 f-170 j, FIG. 1) can be configured in the process space (115, FIG. 1), and the second EM-tuning portions (175 f-175 j, FIG. 1) can be configured within the second EM energy tuning space (169 b, FIG. 1).

In 840, process gas can be supplied into the process chamber above the first and second plasma-tuning rods. During dry plasma etching, the process gas may comprise an etchant, a passivant, or an inert gas, or a combination of two or more thereof. For example, when plasma etching a dielectric film such as silicon oxide (SiO_(x)) or silicon nitride (Si_(x)N_(y)), the plasma etch gas composition generally includes a fluorocarbon-based chemistry (C_(x)F_(y)) such as at least one of C₄F₈, C₅F₈, C₃F₆, C₄F₆, CF₄, etc., and/or may include a fluorohydrocarbon-based chemistry (C_(x)H_(y)F_(z)) such as at least one of CHF₃, CH₂F₂, etc., and can have at least one of an inert gas, oxygen, CO or CO₂. Additionally, for example, when etching polycrystalline silicon (polysilicon), the plasma etch gas composition generally includes a halogen-containing gas such as HBr, Cl₂, NF₃, or SF₆ or a combination of two or more thereof, and may include fluorohydrocarbon-based chemistry (C_(x)H_(y)F_(z)) such as at least one of CHF₃, CH₂F₂, etc., and at least one of an inert gas, oxygen, CO or CO₂, or two or more thereof. During plasma-enhanced deposition, the process gas may comprise a film forming precursor, a reduction gas, or an inert gas, or a combination of two or more thereof.

In 850, uniform microwave plasma can be created by applying first tunable microwave signals to the first plasma-tuning rods and applying second tunable microwave signals to the second plasma-tuning rods.

In some systems, a first set of EM-coupling regions (162 a-162 e, FIG. 1) can be established at first EM-coupling distances (176 a-176 e, FIG. 1) from the first cavity wall (165 a, FIG. 1) within the first EM energy tuning space (169 a, FIG. 1) established in the first cavity assembly (168 a, FIG. 1), and the first set of EM-tuning portions (175 a-175 e, FIG. 1) can extend into the first set of EM-coupling regions (162 a-162 e, FIG. 1). The first EM-tuning portions (175 a-175 e, FIG. 1) can obtain different tunable microwave signals (energies) from the first set of EM-coupling regions (162 a-162 e, FIG. 1), and the different tunable microwave signals (energies) can be transferred to the process space (115, FIG. 1) at the first set of locations (x_(2a)-x_(2e), FIG. 1) using the first set of plasma-tuning portions (170 a-170 e, FIG. 1). The first set of EM-coupling regions (162 a-162 e, FIG. 1) can include tunable E-field regions, tunable H-field regions, maximum E-field regions, maximum H-field regions, maximum voltage regions, maximum energy regions, or maximum current regions, or any combination thereof.

A first set of plasma-tuning slabs (161 a-161 e, FIG. 1) can be coupled to a first set of control assemblies (160 a-160 e, FIG. 1) and can be used to move (163 a-163 e, FIG. 1) the first set of plasma-tuning slabs (161 a-161 e, FIG. 1) a first set of EM-tuning distances (177 a-177 e, FIG. 1) relative to the first set of EM-tuning portions (175 a-175 e, FIG. 1) of the first set of plasma tuning rods {(170 a-170 e) and (175 a-175 e), FIG. 1} within the first EM energy tuning space (169 a, FIG. 1). The first set of control assemblies (160 a-160 e, FIG. 1) and the first set of plasma-tuning slabs (161 a-161 e, FIG. 1) can be used to tune/optimize the different tunable microwave signals (energies) coupled from the first set of EM-coupling regions (162 a-162 e, FIG. 1) to the first set of EM-tuning portions (175 a-175 e, FIG. 1) of the first set of plasma tuning rods {(170 a-170 e) and (175 a-175 e), FIG. 1}. For example, the first set of EM-tuning distances (177 a-177 e, FIG. 1) can be established between the first set of EM-tuning distances (177 a-177 e, FIG. 1) and the first set of plasma-tuning slabs (161 a-161 e, FIG. 1) within the first EM energy tuning space (169 a, FIG. 1), and the first set of EM-tuning distances (177 a-177 e, FIG. 1) can vary from about 0.01 mm to about 1 mm. One or more controllers (195, FIG. 1) can be coupled to the first set of control assemblies (160 a-160 e, FIG. 1) and can be used to control/optimize the movements (163 a-163 e, FIG. 1) of the first set of plasma-tuning slabs (161 a-161 e, FIG. 1). For example, one or more controllers (195, FIG. 1) can be used to control/optimize the first set of EM-tuning distances (177 a-177 e, FIG. 1) to create, optimize, and/or maintain a uniform microwave plasma within the process space (115, FIG. 1) in the process chamber (110, FIG. 1) during substrate processing.

In addition, a second set of EM-coupling regions (162 e-162 j, FIG. 1) can be established at a second set of EM-coupling distances (176 e-176 j, FIG. 1) from the first cavity wall (165 b, FIG. 1) within the second EM energy tuning space (169 b, FIG. 1) established in the second cavity assembly (168 b, FIG. 1), and the second set of EM-tuning portions (175 f-175 j, FIG. 1) can extend into the second set of EM-coupling regions (162 f-162 j, FIG. 1). The second set of EM-tuning portions (175 f-175 j, FIG. 1) can obtain different tunable microwave signals (energies) from the second set of EM-coupling regions (162 f-162 j, FIG. 1), and the different tunable microwave signals (energies) can be transferred to the process space (115, FIG. 1) at the second set of locations (x_(2f)-x_(2j), FIG. 1) using the second set of plasma-tuning portions (170 f-170 j, FIG. 1). The second set of EM-coupling regions (162 f-162 j, FIG. 1) can include tunable E-field regions, tunable H-field regions, maximum E-field regions, maximum H-field regions, maximum voltage regions, maximum energy regions, or maximum current regions, or any combination thereof.

A second set of plasma-tuning slabs (161 f-161 j, FIG. 1) can be coupled to a second set of control assemblies (160 f-160 j, FIG. 1) and can be used to move (163 f-163 j, FIG. 1) the second set of plasma-tuning slabs (161 f-161 j, FIG. 1) a second set of EM-tuning distances (177 f-177 j, FIG. 1) relative to the second set of EM-tuning portions (175 f-175 j, FIG. 1) of the second set of plasma tuning rods {(170 f-170 j) and (175 f-175 j), FIG. 1} within the second EM energy tuning space (169 b, FIG. 1). The second set of control assemblies (160 f-160 j, FIG. 1) and the second set of plasma-tuning slabs (161 f-161 j, FIG. 1) can be used to tune/optimize the different tunable microwave signals (energies) coupled from the second set of EM-coupling regions (162 f-162 j, FIG. 1) to the second set of EM-tuning portions (175 f-175 j, FIG. 1) of the second set of plasma tuning rods {(170 f-170 j) and (175 f-175 j), FIG. 1}. For example, the second set of EM-tuning distances (177 f-177 j, FIG. 1) can be established between the second set of EM-tuning distances (177 f-177 j, FIG. 1) and the second set of plasma-tuning slabs (161 f-161 j, FIG. 1) within the second EM energy tuning space (169 b, FIG. 1), and the second set of EM-tuning distances (177 f-177 j, FIG. 1) can vary from about 0.01 mm to about 1 mm. One or more controllers (195, FIG. 1) can be coupled to the second set of control assemblies (160 f-160 j, FIG. 1) and can be used to control/optimize the second set of movements (163 f-163 j, FIG. 1) of the second set of plasma-tuning slabs (161 f-161 j, FIG. 1). For example, one or more controllers (195, FIG. 1) can be used to control/optimize the second set of EM-tuning distances (177 f-177 j, FIG. 1) to create, optimize, and/or maintain a uniform microwave plasma within the process space (115, FIG. 1) in the process chamber (110, FIG. 1) during substrate processing.

Furthermore, one or more controllers (195, FIG. 1) can be coupled to the EM sources (150 a and 150 b, FIG. 1), the matching networks (152 a and 152 b, FIG. 1), the coupling networks (154 a and 154 b, FIG. 1), and the cavity assemblies (168 a and 168 b, FIG. 1), and at least one controller (195, FIG. 1) can use process recipes to establish, control, and optimize the EM sources (150 a and 150 b, FIG. 1), the matching networks (152 a and 152 b, FIG. 1), the coupling networks (154 a and 154 b, FIG. 1), and the cavity assemblies (168 a and 168 b, FIG. 1) to control the microwave plasma uniformity within the process space (115, FIG. 1).

In 860, the substrate can be processed by moving the substrate through the uniform microwave plasma.

FIG. 9 illustrates a plasma processing system 900 according to embodiments of the invention. The plasma processing system 900 may comprise a dry plasma etching system or a plasma enhanced deposition system.

The plasma processing system 900 comprises a process chamber 910 having a plurality of chamber walls 922 and interface assemblies (922 a and 922 b) configured to define a process space 915. The plasma processing system 900 comprises a substrate holder (not shown) configured to support and/or move 906 the substrate 905 through the process space 915. The substrate 905 is exposed to plasma or process chemistry in process space 915. The plasma processing system 900 can comprise a plurality of cavity assemblies (968 a, 968 b, 968 c, 968 d, 968 e, and 9680 coupled to the interface assemblies (922 a and 922 b). The first cavity assembly 968 a can be coupled to a first set of plasma-tuning rods (911 a and 912 a); the second cavity assembly 968 b can be coupled to a second set of plasma-tuning rods (911 b and 912 b); the third cavity assembly 968 c can be coupled to a third set of plasma-tuning rods (911 c and 912 c); the fourth cavity assembly 968 d can be coupled to a fourth set of plasma-tuning rods (911 d and 912 d); the fifth cavity assembly 968 e can be coupled to a fifth set of plasma-tuning rods (911 e and 912 e); and the sixth cavity assembly 968 f can be coupled to a sixth set of plasma-tuning rods (911 f and 9120. The plurality of plasma-tuning rods (911 a, 912 a, 911 b, 912 b, 911 c, 912 c, 911 d, 912 d, 911 e, 912 e, 911 f, and 9120 can be configured to form plasma in the process space 915. For example, the cavity assemblies (968 a, 968 b, 968 c, 968 d, 968 e, and 9680 and the plasma-tuning rods (911 a, 912 a, 911 b, 912 b, 911 c, 912 c, 911 d, 912 d, 911 e, 912 e, 911 f, and 9120 can be configured using the microwave systems (100, 200, 300, or 400) described herein.

Although only certain embodiments of this invention have been described in detail above, those skilled in the art will readily appreciate that many modifications are possible in the embodiments without materially departing from the novel teachings and advantages of this invention. Accordingly, all such modifications are intended to be included within the scope of this invention.

Thus, the description is not intended to limit the invention and the configuration, operation, and behavior of the present invention has been described with the understanding that modifications and variations of the embodiments are possible, given the level of detail present herein. Accordingly, the preceding detailed description is not mean or intended to, in any way, limit the invention—rather the scope of the invention is defined by the appended claims. 

1. A microwave processing system for processing a substrate comprising: a rectangular process chamber comprising a process space having a movable substrate holder therein; a first cavity assembly coupled to the rectangular process chamber using a first interface assembly, the first cavity assembly having a first electromagnetic (EM) energy tuning space therein, the first interface assembly including a first set of isolation assemblies, wherein a first set of EM-coupling regions, are established in a first EM energy tuning space; a first set of plasma-tuning rods coupled to the first set of isolation assemblies, the first set of plasma-tuning rods having a first set of plasma-tuning portions configured in the process space and a first set of EM-tuning portions configured in the first EM energy tuning space and coupled to at least one of the first set of EM-coupling regions; a second cavity assembly coupled to the rectangular process chamber using a second interface assembly, the second cavity assembly having a second EM energy tuning space therein, the second interface assembly including a second set of isolation assemblies, wherein a second set of EM-coupling regions are established in the second EM energy tuning space; a second set of plasma-tuning rods coupled to the second set of isolation assemblies, the second set of plasma-tuning rods having a second set of plasma-tuning portions configured in the process space and a second set of EM-tuning portions configured in the second EM energy tuning space and coupled to at least one of the second set of EM-coupling regions; and a controller coupled to the first cavity assembly and the second cavity assembly, wherein the controller is configured to control the first set of EM-coupling regions in the first EM energy tuning space and the second set of EM-coupling regions in the second EM energy tuning space, thereby controlling plasma uniformity in the process space.
 2. The microwave processing system of claim 1, further comprising: a first coupling network coupled to the first cavity assembly; a first matching network coupled to the first coupling network; a first EM source coupled to the first matching network, wherein the first EM source is configured to operate in a frequency range from 500 MHz to 5000 MHz; wherein the controller is coupled to the first EM source and configured to control the first EM source, thereby controlling the plasma uniformity in the process space; a second coupling network coupled to the second cavity assembly; a second matching network coupled to the second coupling network; a second EM source coupled to the second matching network, wherein the second EM source is configured to operate in a second frequency range from 500 MHz to 5000 MHz); wherein the controller is coupled to the second EM source and configured to control the second EM source, thereby controlling the plasma uniformity in the process space.
 3. The microwave processing system of claim 1, further comprising: a first plasma-tuning slab configured proximate to the first EM-coupling region in the first EM energy tuning space; a first control assembly coupled to the first plasma-tuning slab through a first cavity assembly wall, the first plasma-tuning slab being positioned at a first EM-coupling distance from the first EM-tuning portion by the first control assembly; wherein the controller is coupled to the first control assembly and is configured to control the first plasma-tuning distance, thereby controlling the plasma uniformity in the process space; a second plasma-tuning slab configured proximate to the second EM-coupling region in the second EM energy tuning space; a second control assembly coupled to the second plasma-tuning slab through a second cavity assembly wall, the second plasma-tuning slab being positioned at a second EM-coupling distance from the second EM-tuning portion by the second control assembly; wherein the controller is coupled to the second control assembly and is configured to control the second plasma-tuning distance, thereby controlling the plasma uniformity in the process space.
 4. The microwave processing system of claim 1, wherein the first set of plasma-tuning rods, the first cavity assembly, the second set of plasma-tuning rods, and the second cavity assembly comprise dielectric material.
 5. The microwave processing system of claim 1, further comprising: a gas showerhead coupled to the rectangular process chamber; a gas supply subassembly coupled to the gas showerhead; and a gas supply system coupled to the gas supply subassembly, wherein the gas showerhead is configured to introduce a process gas to the process space, wherein the controller is coupled to the gas supply system, to the gas supply subassembly, and to the gas showerhead and is configured to control the gas supply system, the gas supply subassembly, and the gas showerhead, thereby controlling the plasma uniformity in the process space.
 6. The microwave processing system of claim 5, wherein the process gas comprises two or more of: C₄F₈, C₈F₈, C₃F₆, C₄F₆, CF₄, CHF₃, CH₂F₂, an inert gas, oxygen, CO, and CO₂.
 7. The microwave processing system of claim 5, wherein the process gas comprises two or more of: HBr, Cl₂, NF₃, SF₆, CHF₃, CH₂F₂, an inert gas, oxygen, CO, and CO₂.
 8. The microwave processing system of claim 1, further comprising: a first cavity-tuning slab configured proximate to a first end of the first EM energy tuning space in the first cavity assembly; a first cavity-control assembly coupled to the first cavity-tuning slab, wherein the first cavity-tuning slab is positioned at a first cavity-tuning distance from at least one wall of the first cavity assembly, wherein the controller is coupled to the first cavity-control assembly and is configured to control the first cavity-tuning distance, thereby controlling the plasma uniformity in the process space; a second cavity-tuning slab configured proximate to the first end of the second EM energy tuning space in the second cavity assembly; and a second cavity-control assembly coupled to the second cavity-tuning slab, wherein the second cavity-tuning slab is positioned at a second cavity-tuning distance from at least one wall of the second cavity assembly, wherein the controller is coupled to the second cavity-control assembly and is configured to control the second cavity-tuning distance, thereby controlling the plasma uniformity in the process space.
 9. The microwave processing system of claim 8, wherein the first cavity-tuning slab, the first cavity-control assembly, the second cavity-tuning slab, and the second cavity-control assembly comprise dielectric material. (I can't find support for dielectric material in spec)
 10. A microwave processing system for processing a substrate comprising: a process chamber comprising a process space having a movable substrate holder therein; a first cavity assembly coupled to the process chamber using a first interface assembly, the first cavity assembly having a first electromagnetic (EM) energy tuning space therein, the first interface assembly including a first isolation assembly, wherein a first pair of EM-coupling regions are established in a first EM energy tuning space; a first pair of plasma-tuning rods coupled to the first isolation assembly, the first pair of plasma-tuning rods having plasma-tuning portions configured in the process space and having EM-tuning portions configured in the first EM energy tuning space, wherein a first EM-tuning portion is coupled to a first EM-coupling region and a second EM-tuning portion is coupled to a second EM-coupling region; a second cavity assembly coupled to the process chamber using a second interface assembly, the second cavity assembly having a second EM energy tuning space therein, the second interface assembly including a second isolation assembly, wherein a second pair of EM-coupling regions are established in the second EM energy tuning space; a second pair of plasma-tuning rods coupled to the second isolation assembly, the second pair of plasma-tuning rods having second plasma-tuning portions configured in the process space and having second EM-tuning portions configured in the second EM energy tuning space, wherein a third EM-tuning portion is coupled to a third EM-coupling region, and a fourth EM-tuning portion is coupled to a fourth EM-coupling region; and a controller coupled to the first cavity assembly and the second cavity assembly, wherein the controller is configured to control the first pair of EM-coupling regions in the first EM energy tuning space and the second pair of EM-coupling regions in the second EM energy tuning space, thereby controlling plasma uniformity in the process space.
 11. The microwave processing system of claim 10, further comprising: a first coupling network coupled to the first cavity assembly; a first matching network coupled to the first coupling network; a first EM source coupled to the first matching network, wherein the first EM source is configured to operate in a frequency range from 500 MHz to 5000 MHz, wherein the controller is coupled to the first EM source and configured to control the first EM source, thereby controlling the plasma uniformity in the process space; a second coupling network coupled to the second cavity assembly; a second matching network coupled to the second coupling network; and a second EM source coupled to the second matching network, wherein the second EM source is configured to operate in a second frequency range from 500 MHz to 5000 MHz, wherein the controller is coupled to the second EM source and configured to control the second EM source, thereby controlling the plasma uniformity in the process space.
 12. The microwave processing system of claim 10, further comprising: a first pair of plasma-tuning slabs configured proximate to the first EM-coupling region in the first EM energy tuning space; a first pair of control assemblies coupled to the first pair of plasma-tuning slabs through a first cavity assembly wall, a first plasma-tuning slab being positioned at a first EM-coupling distance from the first EM-tuning portion by a first control assembly; a second plasma-tuning slab being positioned at a second EM-coupling distance from the second EM-tuning portion by a second control assembly, wherein the controller is coupled to the first control assembly and the second control assembly, the controller being configured to control the first EM-coupling distance and the second EM-coupling distance, thereby controlling the plasma uniformity in the process space; a second pair of plasma-tuning slabs configured proximate to the second EM-coupling region in the second EM energy tuning space; a second pair of control assemblies coupled to the second pair of plasma-tuning slabs through a second cavity assembly wall, a third plasma-tuning slab being positioned at a third EM-coupling distance from the third EM-tuning portion by a third control assembly; and a fourth plasma-tuning slab being positioned at a fourth EM-coupling distance from the fourth EM-tuning portion by a fourth control assembly, wherein the controller is coupled to the first control assembly and the second control assembly, the controller being configured to control the third EM-coupling distance and the fourth EM-coupling distance, thereby controlling the plasma uniformity in the process space.
 13. The microwave processing system of claim 10, further comprising: a gas showerhead coupled to the process chamber; a gas supply subassembly coupled to the gas showerhead; and a gas supply system coupled to the gas supply subassembly, wherein the gas showerhead is configured to introduce a process gas to the process space, wherein the controller is coupled to the gas supply system, to the gas supply subassembly, and to the gas showerhead and is configured to control the gas supply system, the gas supply subassembly, and the gas showerhead, thereby controlling the plasma uniformity in the process space.
 14. A method of processing a substrate using a microwave processing system comprising: positioning a substrate on a movable substrate holder within a process space in a rectangular process chamber; coupling a first cavity assembly to the rectangular process chamber using a first interface assembly, the first cavity assembly having a first EM energy tuning space therein, the first interface assembly including a first set of isolation assemblies, wherein a first set of EM-coupling regions are established in the first EM energy tuning space; coupling a first set of plasma-tuning rods to the first set of isolation assemblies, the first set of plasma-tuning rods having a first set of plasma-tuning portions configured in the process space and a first set of EM-tuning portions configured in the first EM energy tuning space and coupled to at least one of the first set of EM-coupling regions; coupling a second cavity assembly to the rectangular process chamber using a second interface assembly, the second cavity assembly having a second EM energy tuning space therein, the second interface assembly including a second set of isolation assemblies, wherein a second set of EM-coupling regions are established in the second EM energy tuning space; coupling a second set of plasma-tuning rods to the second set of isolation assemblies, the second set of plasma-tuning rods having a second set of plasma-tuning portions configured in the process space and a second set of EM-tuning portions configured in the second EM energy tuning space and coupled to at least one of the second set of EM-coupling regions; and coupling a controller to the first cavity assembly and the second cavity assembly, wherein the controller is configured to control the first set of EM-coupling coupling regions in the first EM energy tuning space and the second set of EM-coupling regions in the second EM energy tuning space, thereby controlling plasma uniformity in the process space.
 15. The method of claim 14, further comprising: coupling a first coupling network to the first cavity assembly; coupling a first matching network to the first coupling network; coupling a first EM source to the first matching network, wherein the first EM source is configured to operate in a frequency range from 500 MHz to 5000 MHz, wherein the controller is coupled to the first EM source and configured to control the first EM source, thereby controlling the plasma uniformity in the process space; coupling a second coupling network to the second cavity assembly; coupling a second matching network to the second coupling network; and coupling a second EM source to the second matching network, wherein the second EM source is configured to operate in a second frequency range from 500 MHz to 5000 MHz, wherein the controller is coupled to the second EM source and configured to control the second EM source, thereby controlling the plasma uniformity in the process space.
 16. The method of claim 14, further comprising: coupling the first cavity assembly to the rectangular process chamber using the first interface assembly, the first cavity assembly having the first electromagnetic (EM) energy tuning space therein, the first interface assembly including the first set of isolation assemblies, wherein the first set of EM-coupling regions are established in the first EM energy tuning space; coupling the first set of plasma-tuning rods to the first set of isolation assemblies, the first set of plasma-tuning rods having the first set of plasma-tuning portions configured in the process space and the first set of EM-tuning portions configured in the first EM energy tuning space and coupled to at least one of the first set of EM-coupling regions; coupling the second cavity assembly to the rectangular process chamber using the second interface assembly, the second cavity assembly having the second EM energy tuning space therein, the second interface assembly including the second set of isolation assemblies, wherein the second set of EM-coupling regions are established in the second EM energy tuning space; coupling the second set of plasma-tuning rods to the second set of isolation assemblies, the second set of plasma-tuning rods having the second set of plasma-tuning portions configured in the process space and the second set of EM-tuning portions configured in the second EM energy tuning space and coupled to at least one of the second set of EM-coupling regions; and controlling the first set of EM-coupling coupling regions in the first EM energy tuning space and controlling the second set of EM-coupling regions in the second EM energy tuning space, thereby controlling the plasma uniformity in the process space, wherein the controller is coupled to the first cavity assembly and to the second cavity assembly.
 17. The method of claim 14, further comprising: coupling a gas showerhead to the rectangular process chamber; coupling a gas supply subassembly to the gas showerhead; and coupling a gas supply system to the gas supply subassembly, wherein the gas showerhead is configured to introduce a process gas to the process space, wherein the controller is coupled to the gas supply system, to the gas supply subassembly, and to the gas showerhead and is configured to control the gas supply system, the gas supply subassembly, and the gas showerhead, thereby controlling the plasma uniformity in the process space.
 18. The method of claim 17, wherein the process gas comprises two or more of: C₄F₈, C₅F₈, C₃F₆, C₄F₆, CF₄, CHF₃, CH₂F₂, an inert gas, oxygen, CO, and CO₂.
 19. The method of claim 17, wherein the process gas comprises two or more of: HBr, Cl₂, NF₃, SF₆, CHF₃, CH₂F₂, an inert gas, oxygen, CO, and CO₂.
 20. The method of claim 14, further comprising: positioning a first cavity-tuning slab proximate to a first end of the first EM energy tuning space in the first cavity assembly; coupling a first cavity-control assembly to the first cavity-tuning slab, wherein the first cavity-tuning slab is positioned at a first cavity-tuning distance from at least one wall of the first cavity assembly, wherein the controller is coupled to the first cavity-control assembly and is configured to control the first cavity-tuning distance, thereby controlling the plasma uniformity in the process space; positioning a second cavity-tuning slab proximate to a second end of the second EM energy tuning space in the second cavity assembly; and coupling a second cavity-control assembly to the second cavity-tuning slab, wherein the second cavity-tuning slab is positioned at a second cavity-tuning distance from at least one wall of the second cavity assembly, wherein the controller is coupled to the second cavity-control assembly and is configured to control the second cavity-tuning distance, thereby controlling the plasma uniformity in the process space. 